Exhibit 99.2
[LOGO]AEHR TEST SYSTEMS

FOR IMMEDIATE RELEASE
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Contacts:

Aehr Test Systems          Financial Relations Board
Bill Barraclough           Amy Cozamanis              Laurie Berman
Director of Marketing      Investor/Analyst Contact   General Inquiries
(510) 623-9400 x282        (310) 854-8314             (310) 854-8315


      AEHR TEST SYSTEMS RECEIVES MTX ORDER FROM VIKING INTERWORKS

Fremont, CA (January 6, 2005) -- Aehr Test Systems (Nasdaq: AEHR), a leading
supplier of semiconductor test and burn-in equipment, today announced it has
received an order for its new MTX model Fp+ test during burn-in system from
Viking InterWorks, the Memory Module Division of Sanmina-SCI.  The system
was shipped in December of 2004.

"Outstanding reliability is a critical supplier criterion of our customers,
and the MTX-Fp+ helps us achieve that requirement," said Paul Sweere, Vice
President of Engineering for Viking InterWorks.  "Aehr Test Systems has been
a valuable partner augmenting our engineering team to help us develop
effective stress and test programs to screen our 256Mb and 512Mb DDR DRAMs,
designing effective burn-in test boards, initially testing our devices in
their facility, and working collaboratively to optimize monitored burn-in
effectiveness and product reliability."

"The order is for a turnkey production solution for burn-in and testing of
advanced memories," said Bill Barraclough, director of marketing of Aehr Test
Systems.  "We believe that the MTX-Fp+ system is ideal for manufacturers who
produce DRAM or flash memories, or both.  This dual functionality is a
cost-effective solution, as it allows manufacturers to use the same capital
equipment for test and burn-in as the product mix changes.  The MTX-Fp+ system
is an enhanced version of Aehr Test's MTX Massively Parallel Test System.
The system adds the capability to burn-in and perform parallel test of flash
memories, in addition to its traditional parallel test and burn-in of DRAMs.
For both applications, the MTX-Fp+ system burns-in and functionally tests
more than 12,000 devices simultaneously."

ABOUT SANMINA-SCI / VIKING INTERWORKS
Sanmina-SCI Corporation is a leading electronics contract manufacturer
serving the fastest-growing segments of the global electronics manufacturing
services (EMS) market.  Recognized as a technology leader, Sanmina-SCI
provides end-to-end manufacturing solutions, delivering unsurpassed quality
and support to OEMs primarily in the communications, defense and aerospace,
industrial and medical instrumentation, computer technology, and multimedia
sectors. Sanmina-SCI has facilities strategically located in key regions
throughout the world.
Viking InterWorks, the Memory Module Division of Sanmina-SCI, designs and
manufactures memory and communications module solutions using DRAM, Flash
and Digital Signal

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Aehr Test Systems Receives MTX Order from Viking InterWorks
January 6, 2005
Page 2

Processing (DSP) technology for use in medical systems, defense/aerospace,
industrial and semiconductor systems, multimedia, computing (enterprise,
personal and business) and communications (wireless and wireline) markets.
Strategic advantages of the Viking InterWorks modular solutions include:
    o Extensive experience in modular solution design and manufacturing
    o Rapid time-to-market with cost effective solutions
    o State-of-the-art and industry standard memory technologies
    o Leaders in providing comprehensive, innovative technologies, using
      DSP, Flash, DRAM and Application Optimized modules

More information regarding the company is available at www.sanmina-sci.com.

ABOUT AEHR TEST SYSTEMS
Headquartered in Fremont, California, Aehr Test Systems is a leading
worldwide provider of systems for burning-in and testing DRAM and logic
integrated circuits and has an installed base of more than 2,500 systems
worldwide.  Aehr Test has developed and introduced several innovative
products, including the FOX(TM), MTX, MAX3 and MAX4 systems, and the
DiePak(R) carrier.  The FOX system is a full wafer contact test and burn-in
system.  The MTX system is a massively parallel test system designed to reduce
the cost of memory testing by performing both test and burn-in on thousands
of devices simultaneously.  The MAX system can effectively burn-in and
functionally test complex devices, such as digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip.  The DiePak
carrier is a reusable, temporary package that enables IC manufacturers to
perform cost-effective final test and burn-in of bare die.  For more
information, please visit the Company's website at www.aehr.com.

SAFE HARBOR STATEMENT
This release contains forward-looking statements that involve risks and
uncertainties relating to projections regarding customer demand and
acceptance of Aehr Test's products.  Actual results may vary from projected
results.  These risks and uncertainties include, without limitation,
acceptance by customers of the MTX technology, acceptance by customers of
the MTX-Fp+ systems shipped upon receipt of a purchase order and the ability
of new products to meet customer needs or perform as described.  See Aehr
Test's recent 10-K and 10-Q reports filed with the SEC for a more detailed
description of the risks facing our business.  The Company disclaims any
obligation to update information contained in any forward-looking statement
to reflect events or circumstances occurring after the date of this press
release.


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