Exhibit 99.1

[LOGO]AEHR TEST SYSTEMS

FOR IMMEDIATE RELEASE

Contact:

Gary Larson
Chief Financial Officer
(510) 623-9400 x321


                  AEHR TEST SYSTEMS REGAINS COMPLIANCE WITH
                        NASDAQ MINIMUM BID PRICE RULE

Fremont, CA (April 4, 2013) - Aehr Test Systems (Nasdaq: AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, today announced that
it has received notification from the NASDAQ Stock Market LLC ("NASDAQ") that
the Company has regained compliance with the $1.00 minimum closing bid price
requirement for continued listing on the NASDAQ Capital Market.

As previously announced, NASDAQ notified the Company on December 26, 2012
that the bid price of the Company's common stock had closed below the minimum
$1.00 per share requirement over the previous 30 consecutive business days
and, as a result, the Company was not in compliance with Listing Rule
5550(a)(2).  The Company was provided 180 calendar days in which to gain
compliance.  In a letter dated April 4, 2013, NASDAQ informed Aehr Test that
it had determined for the last 10 consecutive business days, from March 20,
2013 to April 3, 2013, the closing bid price of the Company's common stock
has been $1.00 or greater.  Accordingly the Company has regained compliance
with NASDAQ Listing Rules 5550(a)(2) and this matter is now closed.

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500 systems
worldwide.  Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, capacity needs and opportunities for Aehr Test products in
package and wafer level test.  Aehr Test has developed and introduced several
innovative products, including the ABTSTM and FOXTM families of test and
burn-in systems and the DiePak(R) carrier.  The ABTS system is used in
production and qualification testing of packaged parts for both low-power
and high-power logic as well as all common types of memory devices.  The FOX
system is a full wafer contact test and burn-in system used for burn-in and
functional test of complex devices, such as leading-


                                 - more -




Aehr Test Systems Regains Compliance With Nasdaq Minimum Bid Price Rule
April 4, 2013
Page 2 of 2


edge memories, digital signal processors, microprocessors, microcontrollers
and systems-on-a-chip. The DiePak carrier is a reusable, temporary package
that enables IC manufacturers to perform cost-effective final test and
burn-in of bare die.  For more information, please visit the Company's website
at www.aehr.com.





                                       ###