Exhibit 99.1

[LOGO]AEHR TEST SYSTEMS

FOR IMMEDIATE RELEASE


Aehr Test Systems                        Investor Relations Contact:
Gary Larson                              Todd Kehrli or Jim Byers
Chief Financial Officer                  MKR Group Inc.
(510) 623-9400 x321                      (323) 468-2300
                                         aehr@mkr-group.com

AEHR TEST SYSTEMS APPOINTS KENNETH B. SPINK TO CHIEF FINANCIAL OFFICER


Fremont, CA (September 4, 2015) - Aehr Test Systems (Nasdaq: AEHR),
a worldwide supplier of semiconductor test and burn-in equipment,
today announced the appointment of Corporate Controller Kenneth B.
Spink as Chief Financial Officer and VP of Finance, effective September
9, 2015. He will succeed Gary Larson, whose previously announced
planned retirement after 24 years with the company is effective the
same day. Mr. Larson will continue to support Mr. Spink on a limited
basis through the end of the calendar year to ensure a seamless
transition.

"Ken is well prepared and has done an excellent job transitioning
to assume the responsibilities of CFO, and it's clear that he is the
right person to be promoted directly to CFO of the company," said
Gayn Erickson, CEO of Aehr Test. "We are fortunate to have someone
of Ken's experience and expertise and I look forward to working with
him as we focus on the new potential significant opportunities we
are seeing for Aehr Test's current and next generation products."

Mr. Spink has served at Aehr Test for seven years and has more than
30 years of accounting and finance experience in the high tech, public
accounting, leasing, service, and construction industries. He was
previously Corporate Accounting Manager at Applied Materials, the
global leader in the semiconductor capital equipment industry, and
began his career with accounting firm Deloitte.

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide
provider of test systems for burning-in and testing logic and memory
integrated circuits and has an installed base of more than 2,500
systems worldwide. Increased quality and reliability needs of the
Automotive and Mobility integrated circuit markets are driving
additional test requirements, capacity needs and opportunities for
Aehr Test products in package and wafer level test.  Aehr Test has
developed and introduced several innovative products, including the
ABTSTM and FOXTM families of test and burn-in systems and the DiePak(R)
carrier. The ABTS system is used in production and qualification
testing of packaged parts for both lower-power and higher-power logic
as well as all common types of memory devices. The FOX system is a
full wafer contact test and burn-in system used for burn-in and
functional test of complex devices, such as leading-edge memories,
digital signal processors, microprocessors, microcontrollers and
systems-on-a-chip. The DiePak carrier is a reusable, temporary package
that enables IC manufacturers to perform cost-effective final test
and burn-in of bare die. For more information, please visit Aehr Test's
website at www.aehr.com.