317 patents
Page 2 of 16
Utility
Test apparatus, test method, and computer-readable storage medium
17 Oct 23
A test apparatus includes: an electrical connection unit electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; an electrical measurement unit for measuring a photoelectric signal obtained by photoelectrically converting the light irradiated from the light source unit by each light emitting device; a light emission control unit for causing at least one light emitting device to be subjected to light emission processing to emit light; a light measuring unit for measuring light emitted by the at least one light emitting device to be subjected to the light emission processing; and a determination unit determining a quality of each light emitting device on the basis of a measurement result of the electrical measurement unit and a measurement result of the light measuring unit.
Kotaro Hasegawa, Kouji Miyauchi, Go Utamaru
Filed: 18 Jan 22
Utility
Test apparatus of antenna array
17 Oct 23
A test apparatus inspects an antenna element or a device including the antenna element as a DUT by OTA.
Koji Asami, Shin Masuda
Filed: 23 Mar 22
Utility
Mitigating an Influence of a Mismatch Loss In a Measurement Setup
12 Oct 23
Embodiments provide an apparatus including at least one of at least one transmission line or a phase shifting device.
Matthias BURCZYK, Andy RICHTER
Filed: 15 Jun 23
Utility
Calibration device, conversion device, calibration method, and non-transitory computer-readable medium having recorded thereon calibration program
10 Oct 23
There is provided a calibration device including: a calibration signal supply unit configured to supply, as a calibration input signal, a multitone signal having tones at a plurality of frequency bands to a converter configured to multiply an input signal by each of a plurality of signal patterns and limit a band to obtain each of a plurality of bandpass signals, and reconstruct an output signal in accordance with the input signal from the plurality of bandpass signals; a calibration bandpass signal acquisition unit configured to acquire a plurality of calibration bandpass signals obtained by the converter in response to the multitone signal; and a calibration processing unit configured to calibrate a parameter for the reconstruction in the converter based on the plurality of calibration bandpass signals.
Koji Asami, Tetsuya Iizuka, Zolboo Byambadorj
Filed: 5 Jun 22
Utility
Test arrangement for testing high-frequency components, particularly silicon photonics devices under test
10 Oct 23
The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a probe head (PH) on a first side thereof, and wherein the probe card (PC) is adapted to be attached to an interface (IF) and wherein the probe card (PC) comprises a plurality of contact pads on a second side in a region opposing at least a region of the interface (IF), arranged to contact a plurality of contacts of the interface (IF), and wherein the probe card (PC) comprises one or more coaxial connectors (CCPT) arranged to mate with one or more corresponding coaxial connectors (CCPT) of the interface (IF).
José Moreira, Zhan Zhang, Hubert Werkmann, Fabio Pizza, Paolo Mazzucchelli
Filed: 13 May 22
Utility
Temperature Control Device, Electronic Component Handling Apparatus, Electronic Component Test Apparatus, and Dut Temperature Control Method
5 Oct 23
A temperature control device controls a temperature of a device under test (DUT) including a device flow path in testing the DUT, and includes: a first flow path that has a first connection port to be connected to an inlet of the device flow path; and a fluid supply system that is connected to the first flow path and supplies a first fluid for temperature control to the device flow path.
Aritomo Kikuchi
Filed: 30 Dec 22
Utility
Electronic Component Handling Apparatus and Electronic Component Testing Apparatus
28 Sep 23
An electronic component handling apparatus that handles a DUT or a carrier accommodating the DUT, including: a pressing device that: electrically connects the DUT to a socket by pressing the DUT or the carrier toward the socket, and includes: a temperature control device that: controls a temperature of the DUT, and includes: a heater unit that is a heat source, the heater unit including: a flat heater; a first heat transfer material disposed on a first main surface of the flat heater; and a second heat transfer material disposed on a second main surface of the flat heater.
Yuya Yamada
Filed: 21 Dec 22
Utility
Temperature Adjusting Device, Electronic Component Handling Apparatus, and Electronic Component Test Apparatus
21 Sep 23
A temperature adjusting device adjusts a temperature of a device under test (DUT) electrically connected to a socket, and includes: a fluid connector connected to a fluid supply source that supplies a fluid; a heat exchanger thermally connected to at least one of the DUT and a carrier holding the DUT in a state that the at least one of the DUT and the carrier is pressed against the socket; a first flow path passing through an inside of the heat exchanger; and a first swirl flow forming part that swirls a flow of the fluid to form a first swirl flow and supplies the first swirl flow to the first flow path, the first swirl swirling along an inner surface of the first flow path around a first central axis of the first flow path.
Yuya Yamada, Aritomo Kikuchi, Yasuyuki Kato
Filed: 1 Feb 23
Utility
Optical testing apparatus and method of testing optical measuring instrument
19 Sep 23
An optical testing apparatus is used in testing an optical measuring instrument.
Toshihiro Sugawara, Takao Sakurai
Filed: 7 Aug 20
Utility
Semiconductor device, manufacturing method of semiconductor device and testing device
19 Sep 23
Provided is a semiconductor device, including: a compound semiconductor layer; a first insulating film provided on the compound semiconductor layer; a second insulating film, which is formed of a material different from the first insulating film, provided on the first insulating film; and a gate electrode provided above the second insulating film.
Kensuke Okumura, Tomoo Yamanouchi
Filed: 17 Mar 21
Utility
Laser beam output apparatus
19 Sep 23
According to the present invention, a pulsed laser output section outputs a laser beam having a predetermined wavelength as first pulses.
Takao Sakurai
Filed: 3 Nov 21
Utility
Methods and Devices for Testing a Device Under Test Using Multiple Signals Transmitted Via a Bidirectional Real-time Interface
7 Sep 23
Embodiments of the present invention provide an automated test equipment (a “tester”) for testing a device under test, including a bidirectional dedicated real-time handler interface.
Matthias WERNER, Martin FISCHER
Filed: 31 Jan 23
Utility
Determining performance metrics for a device under test using nearfield measurement results
5 Sep 23
Embodiments of the present invention provide systems and methods for performing tests on a device under test (DUT) based on training data derived from a set of training DUTs using nearfield measurement data.
José Moreira
Filed: 2 Jun 22
Utility
Power Supply Device
31 Aug 23
A power supply apparatus includes multiple channels of power supply units coupled in a stack connection.
Takahiko SHIMIZU, Shoichiro IMAI
Filed: 4 May 23
Utility
Flexible sideband support systems and methods
22 Aug 23
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system.
Srdjan Malisic, Chi Yuan, Seth Craighead
Filed: 8 Mar 21
Utility
Biosensor
17 Aug 23
A container holds a liquid sample containing a substrate to be detected.
Kiyoto NAKAMURA
Filed: 21 Apr 23
Utility
Multiple-name-space Test Systems and Methods
17 Aug 23
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system.
Srdjan Malisic, Chi Yuan
Filed: 25 Apr 23
Utility
Electronic Component Handling Apparatus and Electronic Component Testing Apparatus
10 Aug 23
An electronic component handling apparatus that handles a pressed body including a DUT or a carrier accommodating the DUT, includes: a pressing device that electrically connects the DUT to a socket by pressing the pressed body toward the socket, and includes: a contact plate that contacts the pressed body; and a retainer that holds the contact plate, the contact plate being separated from the retainer while the contact plate contacts the pressed body, and the contact plate being held by the retainer while the contact plate is separated from the pressed body.
Yuya Yamada
Filed: 21 Dec 22
Utility
Burn-in board and burn-in apparatus
8 Aug 23
A burn-in board includes: a board; sockets mounted on the board; a connector mounted on the board; and wiring systems disposed in the board and connecting the sockets and the connector.
Hiroaki Takeuchi, Koji Hirashima, Kenji Nishi, Chen-Pi Chang, Wen Yung Wu
Filed: 25 Mar 22
Utility
Electronic component handling apparatus and electronic component testing apparatus
1 Aug 23
An electronic component handling apparatus handles a device under test (DUT).
Hiromitsu Horino, Yoshitaka Takeuchi, Yoshinori Arai, Hiroyuki Kikuchi
Filed: 25 Jun 21