135 patents
Page 2 of 7
Utility
Test carrier
4 Jul 23
A test carrier that accommodates a device under test (DUT) and has a through-hole facing the DUT, including: a movable valve that: opens by suction through the through hole such that the DUT is sucked through the through hole.
Toshiyuki Kiyokawa
Filed: 22 Oct 21
Utility
Sensor test apparatus
4 Jul 23
Kazunari Suga, Daisuke Takano, Satoshi Hanamura, Michiro Chiba, Hisao Nishizaki, Atsushi Hayakawa
Filed: 19 Sep 19
Utility
Multiple name space test systems and methods
16 May 23
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system.
Srdjan Malisic, Chi Yuan
Filed: 5 Mar 21
Utility
Optical testing apparatus
25 Apr 23
An optical testing device for use in testing an optical measuring instrument provides incident light from a light source to an incident object and receives reflected light due to reflection of the incident light at the incident object.
Toshihiro Sugawara, Shin Masuda, Takao Sakurai, Hidenobu Matsumura, Takao Seki
Filed: 1 Apr 20
Utility
Enhanced loopback diagnostic systems and methods
4 Apr 23
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system.
Mei-Mei Su, Seth Craighead
Filed: 8 Mar 21
Utility
Sensor test apparatus
28 Mar 23
A sensor test apparatus having excellent versatility is provided.
Kazunari Suga, Daisuke Takano, Satoshi Hanamura, Michiro Chiba, Hisao Nishizaki, Atsushi Hayakawa
Filed: 19 Sep 19
Utility
Multiple output isolated power supply for automated test equipment and a method for providing multiple isolated output voltages
21 Mar 23
A multiple output isolated power supply for the usage as a floating V/I source in an automated test equipment.
Atsushi Nakamura, Anton Thoma
Filed: 9 Apr 20
Utility
Control device for magnetic field generator, test apparatus, and magnetic field control method
14 Mar 23
A control device controls a magnetic field generated by a magnetic field generator, and includes a magnetic field controller that controls the magnetic field generator based on a detected value by a magnetic field sensor.
Toshiyuki Omuro, Takashi Kimura
Filed: 7 Dec 21
Utility
Test carrier and electronic component testing apparatus
14 Feb 23
A test carrier that accommodates a DUT and includes a first flow passage through which fluid supplied from an outside of the test carrier flows.
Toshiyuki Kiyokawa, Yuya Yamada
Filed: 25 Feb 22
Utility
Electronic component handling apparatus and electronic component testing apparatus
14 Feb 23
An electronic component handling apparatus handles a device under test (DUT).
Yoshinori Arai, Yoshitaka Takeuchi, Hiroyuki Kikuchi
Filed: 25 Jun 21
Utility
Electronic component handling apparatus and electronic component testing apparatus
7 Feb 23
An electronic component handling apparatus handles a DUT and includes: an acquiring device that acquires current three-dimensional shape data of a DUT container having a plurality of accommodating portions each capable of accommodating the DUT; and a computer device that: calculates a first correction amount from the current three-dimensional shape data and corrects the current three-dimensional shape data based on the first correction amount; extracts, from the corrected three-dimensional shape data, at least one of a height and a slope of each of predetermined regions of the DUT container; and determines an accommodation state of the DUT based on an extraction result.
Masataka Onozawa, Yuki Koba
Filed: 12 Nov 21
Utility
Test arrangement for testing high-frequency components, particularly silicon photonics devices under test
24 Jan 23
The invention relates to a probe card (PC) for use with an automatic test equipment (ATE), wherein the probe card (PC) comprises a probe head (PH) on a first side thereof, and wherein the probe card (PC) is adapted to be attached to an interface (IF) and wherein the probe card (PC) comprises a plurality of contact pads on a second side in a region opposing at least a region of the interface (IF), arranged to contact a plurality of contacts of the interface (IF), and wherein the probe card (PC) comprises one or more coaxial connectors (CCPT) arranged to mate with one or more corresponding coaxial connectors (CCPT) of the interface (IF).
José Moreira, Zhan Zhang, Hubert Werkmann, Fabio Pizza, Paolo Mazzucchelli
Filed: 30 Oct 20
Utility
Test carrier and carrier assembling apparatus
20 Dec 22
A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; and a lid member that covers the DUT and is attached to the carrier body.
Toshiyuki Kiyokawa, Kazuya Ohtani
Filed: 12 Mar 19
Utility
Power supply, automated test equipment, method for operating a power supply, method for operating an automated test equipment and computer program using a voltage variation
20 Dec 22
A power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is triggered in response to an expected load change.
Franz Rottner, Martin Fischer, Alois Thalmaier, Rudi Bauer
Filed: 8 Jun 20
Utility
High density waveguide assembly for millimeter and 5G applications
22 Nov 22
Embodiments of the present disclosure use a customizable ganged waveguide that comprises a top metal plate and a bottom metal plate with trenches that come together in a way so as to form waveguide channels.
Roger McAleenan, YuChang Liu
Filed: 1 Jul 20
Utility
Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
15 Nov 22
An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface.
Marc Mössinger
Filed: 30 Oct 20
Utility
Optical device
15 Nov 22
According to the present invention, an optical device includes: a first electro-optical member and a second electro-optical member.
Hideo Hara, Shunsuke Abe, Shin Masuda
Filed: 30 Aug 18
Utility
Electronic component handling apparatus, electronic component testing apparatus, and socket
8 Nov 22
An electronic component handling apparatus includes: a moving device that moves a device under test (DUT) including a first antenna and presses the DUT against a socket.
Natsuki Shiota, Aritomo Kikuchi
Filed: 30 Nov 20
Utility
NVMe-MI over SMBus multi-master controller with other SMBus and I2C masters in a single FPGA chip
8 Nov 22
A method for conducting bus arbitration in a hardware tester system comprising a single master controller and a multi-master controller comprises configuring the single master controller with arbitration logic operable to communicate on a bus in the hardware tester system using a same arbitration scheme as the multi-master controller, wherein the single master controller and the multi-master controller are connected to the bus.
Yogen Krishnapillai, Linden Hsu, Mike Bautista
Filed: 8 Feb 21
Utility
Laser beam output apparatus
18 Oct 22
A pulsed laser output section outputs a laser beam having a predetermined wavelength as first pulses.
Takao Sakurai
Filed: 12 Mar 21