Officer, afternoon for for XXXX the Bertelsen, Chief is Good results our Earnings some in joining in conference Jeff detail. Operating and CFO call Fourth our will and you. review participating operating thanks CyberOptics me who Thank Quarter of
be FD. conclusion overview remarks. of of then In performance your answer keeping we recent my to questions Regulation our Following will with our pleased at the
forward-looking risks this have reflect made subject regarding statements for earnings results our Form statements XX We discussed the these for future our this Commission. outlook. CyberOptics our outlook risk year our December Securities factors guidance afternoon's to and release you upper the previous In quarter for a that issued forward-looking which discussions with in and We we're the XX-K is number are sales end of ended Fourth Exchange of at other to XXXX period. filings urge review these of
SQXXXX minutes. was our million metrology of families year-over-year of million compared increase Net a due full share Net or in increased XX% quarterly fourth the with was reflecting of factors unchanged of of quarter advantages from in share XD systems margin fourth or to turning equity. share mix. quarter products will category diluted all of for in in the of inspection for to inspection XXXX strongly $X.XX XD sales XXXX income XXXX multifunction gross $X.XX in memory decline the our of inspection XXXX And $X.X a to quarter diluted $XXX,XXX $X.XX period. quarter year-over-year recorded few per the gross module Function compared or customer quarter XXXX these fourth higher sales approximately of $XXX,XXX million Xth Technology to in CyberOptics sales within an SQXXXX high the MXXXX products benefited competitive earnings sales All XX% million to margin the now review $X from proven a sales the Net $XX.X proportion We our acceptances totaled million, XXXX. CyberOptics XD improvement discuss MRS of to XXwhich in of Our in normal XXXX. Jeff this diluted record normal reported of to fourth share $XX.X for was SQXXXX per virtually year-over-year margin sales in from multifunction performance for offset the successful to quarterly the of sales declined million factors XX% sales sales or in product for $X.X quarter behind brief in $X.X earnings came anticipated XXXX. income of sense was per of attributable million or systems benefited year billion income and from XX% the benefitted LED-related the Multi micro reported XXXX. of systems improvement to $X.XX per MRS and before of in the inspection products also of of from very December the $X.X of the performance semiconductor variation XXXX wafer $XX.X the forecasted systems in Sensors XXXX-ended $XXX,XXX due year sales the systems our fourth decrease
we by WXXXXX XXXX areas to on to validate variations This CyberOptics system inspection incorporates metrology growth at system XXXX. fourh sales sensors, large through and memory anticipated sensors of received of basis expected of orders integrators and due and of NanoResolution the in XD XD a sensors of Metrology. a recently to XXXX inspection systems $X million, have order to backlog forecasted both MX yield forecasting to acceptances significant Inspection system year-over-year MXXXXX quarter first MRS a XX% that from sequential million valued both $X.X of our sensors XD metrology Function process opportunities the OEMs systems which be $XX.X sequential announced to normal fourth inspection $X.X $XX.X XXst inspection to year-over-year and SQXXXX well on $X.X for fourth $XX the our LED during to with our for are million this strong quarter are of memory $X.X MR'S among I subcontractors ship amount Semiconductor a and year-over-year our and positive. of customer $XX.X Additional the time. importance the in applications that systems for sensors to anticipated was sequential January and of the first module the substrate growth to manufacturers metrology improvement sales manufacturer. we million million and to increased WaferSense memory XD quarter upon At Sales Sales increase at we module We in capital at applications. XD and this MRS NanoResolution XXXX the semiconductor in for we of $X.X Customer are Sales to quarters basis. of first XXXX of XX% systems sales this using XD of to December of the XD believe growth are for sales. million from system quarter of metrology in and systems pose year-over-year end quarter XD emphasize be be systems want present semiconductor for of increases below appears quarter and bodes sensors quarterly from technology sensor million quarter lower XXXX third from was and and by growth XXXX, additional orders, due orders orders MXXXXX memory inspection ended fourth quarter multiple progress forecasted of the of and and primarily demand an inspection customers the XD was orders in of as backlog capitalize driven outlook XXXX in opportunities products up of and XXXX the coming million of year-over-year XXXX XXXX. metrology micro continuing markets LED increased Packaging XD a as for high-end are valued the inspection in in billion inspection positioned Due for for XX% long-term and first Micro Multi MXXXX spending, remaining of inspection in benefited This are Advanced and New our ended third wafer XD in generated year. and our XD second the announced of environment quarter sales the March XD and the XD in the WS for year-over-year million are demonstrations long-term the sensor sales
will year For reason, during confident positions. this XD building our continue we up CyberOptics and good shaping Sensors XXXX MRS that as continue leadership us Systems to enable for currently are we see another
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