you. Thank
thanks quarter CyberOptics of and for conference participating second the XXXX. for afternoon earnings in call Good
forward-looking Joining outlook me some Regulation keeping is statements which XX, These then at Operating for forward-looking overview of discussions Officer, our you outlook the a Jeff made our FD, this will of the Bertelsen, in our will results, release. of afternoon's regarding our ended answer statements factors. are our XXXX, we risk XX-K CFO reflect for future be filings urge with to review conclusion pleased our Securities is have number results your performance. review of with in recent December earnings other detail to the my year Form who to and following these our subject and We and questions We discussed Exchange Chief risks that in In remarks. Commission.
performance. earnings or of quarter. million diluted for of increase to second up year-over-year for take the quarter or second share lines. sales, advantage was our $X.XX million from record. Turning inspection of sales electronics million year's effect, now an income per quarter environment by ended guidance, $XX.X CyberOptics the record products sensing $X.X from quarterly of from capital the XX% allowing diluted metrology share, our quarter quarter of are each our an robust and in this growth to industry-leading double-digit which targeted strong $X.XX previously This reported and $XX to June driven Net year-earlier all-time spending per came performance significantly In XXXX marked We issued XX, sales markets. million $X.X recent of semiconductor CyberOptics XXXX. product our the exceeded optimum second second in of our in
and by growth which This for of product in will applications. million, second sales the from XD post XXXX. XX% by year-over-year year-over-year to rose performance $X.X driven quarter are million quarter our review XD metrology family. high strong XD OEM semiconductors I and Sensor sensors, third Now MRS growth was sensors minutes, Sales year-over-year ongoing the second in of to to of end sales next XXXX. increased quarter reflecting electronics customers inspection robust of forecasted the demand XX% and for $X.X few
Demand part million. strong and the forecasted yield fabs. this generated sensors quarter building of are process improvement of year-over-year XXXX. for to semiconductor new third quarter by being metrology the inspection million. and increased Sales year-over-year XX% product to the systems SQXXXX sales in XX% systems inspection for $X.X both believe of quarter rose XXXX increased our inspection We our sensors. products in While second to new semiconductor quarterly are MRS speaking I packaging XD year-over-year consisting MRS of of system customer and sensors, want to product, growth capitalize for and upon $X.X Sales of add applications, longer-term sensors WXXXXX XX% incorporates the continuing metrology a mainly multifunction of Within of Sales XXXX. $XX.X demonstrations that year-over-year the products post in CyberOptics of to for as growth record sensors, of well that wafer of advanced NanoResolution WaferSense are to NanoResolution positioning second quarter significant second million is in category, opportunities. WaferSense as this
year's in XD customer inspection million systems million Second $X.X of memory acceptances benefited third for of Customer expected MXXXXX systems. this $X.X of are from quarter. also quarter system sales MXXXXX module acceptances
for XD acceptance first $X.X order of MXXXXX for of second module Customer first Following received CyberOptics placed million the end multifunction XD is of SQXXXX CyberOptics XD for system. totaling slated quarter, existing systems this customer inspection metrology. system system this inspection for memory quarter, existing orders its three MXXXX a customers its and second quarter year's LED mini and XXXX. In the from for new
outlook and remains inspection for Our long-term mini metrology growth LED applications promising.
inspection We manufacturing also XXXX XX, at and backlogs for of a recently and received processes. follow-on year-over-year on printer at up sensors, record inline SQXXXX of XD sensors. systems strong backlog third million and XX, for basis. XXXX forecasted order quarter SQXXXX MXXXXX metrology Sales grow component a cartridge and $XX.X CyberOptics in in semiconductor totaled metrology of June $X.X reflecting totaling million, MRS from orders inspection to million March systems $XX.X multifunction are the systems XXXX, solidly
quarter As products. revenues XX, a from third ending third due of It's $XX quarterly of to for systems of to MX will result, the we quarter million in million sales the forecasting million there no $XX.X XXXX. module the quarter September memory fourth XXXX these anticipated $XX compared in XXXX, of be variability normal to of that sales are in
sales in reason, a be the fourth are quarterly sequential basis. this For XXXX expected on lower quarter of to
by is capital driven company's growth record and environment. for quarter spending fourth sales the of year-over-year strong However, anticipated robust XXXX, backlog
Looking positive will foreseeable market to into CyberOptics performance future. ahead, the continue we believe conditions benefit
MRS strong us industry-leading spending advantage to capital technology platforms optimum are environment. WaferSense enabling and take Our of the
we about CyberOptics' prospects are optimistic going reasons, forward. these Thank For you.
Now, performance detail. our will quarter greater review Jeff Bertelsen in second