24 patents
Utility
Abbreviated Loopback Attenuation
7 Dec 23
Improved performance for attenuated testing when probing a device under test with a probe array is provided.
Ernest Gammon McReynolds, Jerry Martyniuk, Tim Lesher, Tomoe Yokoyama, David Raschko, Uyen Nguyen, Pratik Bakul Ghate
Filed: 5 Jun 23
Utility
Vertical probe array having sliding contacts in elastic guide plate
10 Aug 23
A probe array having decoupled electrical and mechanical design constraints on the probes is provided.
January Kister, Kevin John Hughes
Filed: 8 Feb 23
Utility
Probes That Define Retroreflectors, Probe Systems That Include the Probes, and Methods of Utilizing the Probes
20 Apr 23
Probes that define retroreflectors, probe systems that include the probes, and methods of utilizing the probes.
Quan Yuan, Joseph George Frankel
Filed: 27 Sep 22
Utility
Thermal management techniques for high power integrated circuits operating in dry cryogenic environments
6 Apr 23
Improved heat sinking of electronic and/or photonic integrated circuit chips is provided by including thermal-only contacts on unused parts of the chip.
Michael Snow
Filed: 30 Sep 22
Utility
Cryogenic Wafer Testing System
19 Jan 23
Cryogenic testing systems for testing electronic components such as wafers under cryogenic conditions are provided.
Michael Snow, Joshua West
Filed: 19 Nov 20
Utility
Method of centering probe head in mounting frame
1 Sep 22
A modular probe array for making temporary electrical contact to devices under test is provided.
Kalyanjit Ghosh, Doug Ondricek, Paul Hsiao
Filed: 28 Feb 22
Utility
Probe Systems Configured to Test a Device Under Test and Methods of Operating the Probe Systems
28 Jul 22
Probe systems configured to test a device under test and methods of operating the probe systems are disclosed herein.
Martin Schindler, Stefan Kreissig, Torsten Kiel
Filed: 20 Oct 21
Utility
Probe Head Including a Guide Plate with Angled Holes to Determine Probe Flexure Direction
28 Jul 22
Vertical probe arrays having angled guide plates are provided.
Sterling Tadashi Collins, Jason William Cosman, Lich Thanh Tran, Vinh-Lam Olivier Buu
Filed: 28 Jan 22
Utility
Multi-Conductor Transmission Line Probe
16 Dec 21
Vertical transmission line probes having alternating capacitive and inductive sections are provided.
Tim Lesher, Jason William Cosman
Filed: 11 Jun 21
Utility
Methods of Producing Augmented Probe System Images and Associated Probe Systems
2 Dec 21
Methods of producing augmented probe system images and associated probe systems.
Anthony James Lord, Gavin Neil Fisher, David Randle Hess
Filed: 6 May 21
Utility
3D electrical integration using component carrier edge connections to a 2D contact array
2 Dec 21
3D electrical integration is provided by connecting several component carriers to a single substrate using contacts at the edges of the component carriers making contact to a 2D contact array (e.g., a ball grid array or the like) on the substrate.
Roy J. Henson, Shawn O. Powell
Filed: 28 May 21
Utility
Beamforming Device Testing
8 Jul 21
Improved electrical testing of N-port beamforming devices is provided.
Dennis Rosenauer, Roger Hayward, Roy Swart
Filed: 7 Jan 21
Utility
Double-sided Probe Systems with Thermal Control Systems and Related Methods
24 Jun 21
Double-sided probe systems with thermal control systems and related methods.
Masahiro Sameshima
Filed: 3 Dec 20
Utility
Customizable Probe Cards, Probe Systems Including the Same, and Related Methods
10 Jun 21
Customizable probe cards, probe systems including the same, and related methods.
Yoichi Funatoko, Nobuhiro Kawamata, Masahiro Sameshima, Masanori Watanabe
Filed: 5 Nov 20
Utility
Probe Systems Including Imaging Devices with Objective Lens Isolators, and Related Methods
6 May 21
Probe systems including imaging devices with objective lens isolators and related methods are disclosed herein.
Kazuki Negishi, Yu-Wen Huang, Gerald Lee Gisler, Eric Robert Christenson, Michael E. Simmons
Filed: 23 Oct 20
Utility
Probe Systems and Methods for Testing a Device Under Test
6 May 21
Probe systems and methods for testing a device under test are disclosed herein.
Kazuki Negishi
Filed: 21 Oct 20
Utility
Methods for Maintaining Gap Spacing Between an Optical Probe of a Probe System and an Optical Device of a Device Under Test, and Probe Systems That Perform the Methods
1 Apr 21
Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test and probe systems that perform the methods.
Joseph George Frankel
Filed: 29 Jun 20
Utility
Probe Systems for Optically Probing a Device Under Test and Methods of Operating the Probe Systems
1 Apr 21
Probe systems for optically probing a device under test (DUT) and methods of operating the probe systems.
Joseph George Frankel, Kazuki Negishi, Michael E. Simmons, Eric Robert Christenson, Daniel Rishavy
Filed: 15 Sep 20
Utility
Probe Systems and Methods for Characterizing Optical Coupling Between an Optical Probe of a Probe System and a Calibration Structure
1 Apr 21
Probe systems and methods of characterizing optical coupling between an optical probe of a probe system and a calibration structure.
Joseph George Frankel, Kazuki Negishi
Filed: 22 Sep 20
Utility
Calibration Chucks for Optical Probe Systems, Optical Probe Systems Including the Calibration Chucks, and Methods of Utilizing the Optical Probe Systems
2 Dec 20
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems.
Kazuki Negishi, Michael E. Simmons, Christopher Anthony Storm, Joseph George Frankel, Eric Robert Christenson, Mario René Berg
Filed: 26 May 20