29 patents
Utility
Probe systems including imaging devices with objective lens isolators, and related methods
16 Jan 24
Probe systems including imaging devices with objective lens isolators and related methods are disclosed herein.
Kazuki Negishi, Yu-Wen Huang, Gerald Lee Gisler, Eric Robert Christenson, Michael E. Simmons
Filed: 23 Oct 20
Utility
Methods of producing augmented probe system images and associated probe systems
21 Nov 23
Methods of producing augmented probe system images and associated probe systems.
Anthony James Lord, Gavin Neil Fisher, David Randle Hess
Filed: 6 May 21
Utility
Method and device for optically representing electronic semiconductor components
12 Sep 23
The invention relates to a method for optically representing electronic semiconductor components 2 on structural units 1 as used for contacting semiconductor components, and to a device which can be used for this purpose.
Jens Fiedler, Sebastian Gießmann
Filed: 19 Nov 18
Utility
3D electrical integration using component carrier edge connections to a 2D contact array
11 Apr 23
3D electrical integration is provided by connecting several component carriers to a single substrate using contacts at the edges of the component carriers making contact to a 2D contact array (e.g., a ball grid array or the like) on the substrate.
Roy J. Henson, Shawn O. Powell
Filed: 28 May 21
Utility
Probe systems configured to test a device under test and methods of operating the probe systems
7 Mar 23
Probe systems configured to test a device under test and methods of operating the probe systems are disclosed herein.
Martin Schindler, Stefan Kreissig, Torsten Kiel
Filed: 20 Oct 21
Utility
Multi-conductor transmission line probe
1 Nov 22
Vertical transmission line probes having alternating capacitive and inductive sections are provided.
Tim Lesher, Jason William Cosman
Filed: 11 Jun 21
Utility
Direct metalized guide plate
4 Oct 22
Improved electrically conductive guide plates for vertical probe arrays are provided by patterning a thin metal layer disposed on an insulating substrate.
Jason William Cosman, Benjamin N. Eldridge, Eric Hill, John Ebner, Edin Sijercic
Filed: 18 Oct 18
Utility
Microscopes with objective assembly crash detection and methods of utiliizing the same
27 Sep 22
Microscopes with objective assembly crash detection and methods of utilizing the same are disclosed herein.
Gerald Lee Gisler, Sia Choon Beng, Anthony James Lord, Gavin Neil Fisher
Filed: 24 Jan 20
Utility
Double-sided probe systems with thermal control systems and related methods
5 Jul 22
Double-sided probe systems with thermal control systems and related methods.
Masahiro Sameshima
Filed: 3 Dec 20
Utility
Probe systems and methods for testing a device under test
31 May 22
Probe systems and methods for testing a device under test are disclosed herein.
Kazuki Negishi
Filed: 21 Oct 20
Utility
Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure
26 Apr 22
Probe systems and methods of characterizing optical coupling between an optical probe of a probe system and a calibration structure.
Joseph George Frankel, Kazuki Negishi
Filed: 22 Sep 20
Utility
Probe on carrier architecture for vertical probe arrays
5 Apr 22
A probe-on-carrier architecture is provided, where several vertical probes are disposed on each probe carrier and the probe carriers are affixed to the space transformer.
Mukesh Selvaraj, January Kister
Filed: 27 Apr 20
Utility
Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test, and probe systems that perform the methods
21 Dec 21
Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test and probe systems that perform the methods.
Joseph George Frankel
Filed: 29 Jun 20
Utility
Probe systems and methods including electric contact detection
23 Nov 21
Probe systems and methods including electric contact detection.
Sia Choon Beng, Kazuki Negishi
Filed: 23 May 19
Utility
Electrical test probes having decoupled electrical and mechanical design
26 Oct 21
Probes for testing electrical circuits having decoupled electrical and mechanical design are provided.
January Kister, Roy Swart, Edin Sijercic
Filed: 13 Jun 19
Utility
MEMS probe card assembly having decoupled electrical and mechanical probe connections
26 Oct 21
Probes are connected to the space transformer via multiple carrier plates.
Mukesh Selvaraj, January Kister
Filed: 30 Oct 18
Utility
Probe systems for optically probing a device under test and methods of operating the probe systems
28 Sep 21
Probe systems for optically probing a device under test (DUT) and methods of operating the probe systems.
Joseph George Frankel, Kazuki Negishi, Michael E. Simmons, Eric Robert Christenson, Daniel Rishavy
Filed: 15 Sep 20
Utility
Probe tip with embedded skate
6 Jul 21
A skate on a tip of a probe for testing electrical devices is a reduced thickness probe tip contact.
January Kister, Chun-Chih Wang
Filed: 22 Mar 19
Utility
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems
29 Jun 21
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems.
Kazuki Negishi, Michael E. Simmons, Christopher Anthony Storm, Joseph George Frankel, Eric Robert Christenson, Mario René Berg
Filed: 27 May 20
Utility
Probe systems and methods
29 Jun 21
Probe systems and methods are disclosed herein.
Gavin Neil Fisher, Thomas Reiner Thaerigen, Peter McCann, Rodney Jones, Koby L. Duckworth
Filed: 11 Oct 19