53 patents
Page 2 of 3
Utility
Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test, and probe systems that perform the methods
21 Dec 21
Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test and probe systems that perform the methods.
Joseph George Frankel
Filed: 29 Jun 20
Utility
Multi-Conductor Transmission Line Probe
16 Dec 21
Vertical transmission line probes having alternating capacitive and inductive sections are provided.
Tim Lesher, Jason William Cosman
Filed: 11 Jun 21
Utility
Methods of Producing Augmented Probe System Images and Associated Probe Systems
2 Dec 21
Methods of producing augmented probe system images and associated probe systems.
Anthony James Lord, Gavin Neil Fisher, David Randle Hess
Filed: 6 May 21
Utility
3D electrical integration using component carrier edge connections to a 2D contact array
2 Dec 21
3D electrical integration is provided by connecting several component carriers to a single substrate using contacts at the edges of the component carriers making contact to a 2D contact array (e.g., a ball grid array or the like) on the substrate.
Roy J. Henson, Shawn O. Powell
Filed: 28 May 21
Utility
Probe systems and methods including electric contact detection
23 Nov 21
Probe systems and methods including electric contact detection.
Sia Choon Beng, Kazuki Negishi
Filed: 23 May 19
Utility
Electrical test probes having decoupled electrical and mechanical design
26 Oct 21
Probes for testing electrical circuits having decoupled electrical and mechanical design are provided.
January Kister, Roy Swart, Edin Sijercic
Filed: 13 Jun 19
Utility
MEMS probe card assembly having decoupled electrical and mechanical probe connections
26 Oct 21
Probes are connected to the space transformer via multiple carrier plates.
Mukesh Selvaraj, January Kister
Filed: 30 Oct 18
Utility
Probe systems for optically probing a device under test and methods of operating the probe systems
28 Sep 21
Probe systems for optically probing a device under test (DUT) and methods of operating the probe systems.
Joseph George Frankel, Kazuki Negishi, Michael E. Simmons, Eric Robert Christenson, Daniel Rishavy
Filed: 15 Sep 20
Utility
Beamforming Device Testing
8 Jul 21
Improved electrical testing of N-port beamforming devices is provided.
Dennis Rosenauer, Roger Hayward, Roy Swart
Filed: 7 Jan 21
Utility
Probe tip with embedded skate
6 Jul 21
A skate on a tip of a probe for testing electrical devices is a reduced thickness probe tip contact.
January Kister, Chun-Chih Wang
Filed: 22 Mar 19
Utility
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems
29 Jun 21
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems.
Kazuki Negishi, Michael E. Simmons, Christopher Anthony Storm, Joseph George Frankel, Eric Robert Christenson, Mario René Berg
Filed: 27 May 20
Utility
Probe systems and methods
29 Jun 21
Probe systems and methods are disclosed herein.
Gavin Neil Fisher, Thomas Reiner Thaerigen, Peter McCann, Rodney Jones, Koby L. Duckworth
Filed: 11 Oct 19
Utility
Double-sided Probe Systems with Thermal Control Systems and Related Methods
24 Jun 21
Double-sided probe systems with thermal control systems and related methods.
Masahiro Sameshima
Filed: 3 Dec 20
Utility
Customizable Probe Cards, Probe Systems Including the Same, and Related Methods
10 Jun 21
Customizable probe cards, probe systems including the same, and related methods.
Yoichi Funatoko, Nobuhiro Kawamata, Masahiro Sameshima, Masanori Watanabe
Filed: 5 Nov 20
Utility
Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality of DUTs, which is a subset of the test subset, with a pre-test
25 May 21
Methods of controlling the operation of probe stations and probe stations that perform the methods.
Sia Choon Beng, David Randle Hess, Chunyi Yin Leong
Filed: 23 May 19
Utility
Probe Systems Including Imaging Devices with Objective Lens Isolators, and Related Methods
6 May 21
Probe systems including imaging devices with objective lens isolators and related methods are disclosed herein.
Kazuki Negishi, Yu-Wen Huang, Gerald Lee Gisler, Eric Robert Christenson, Michael E. Simmons
Filed: 23 Oct 20
Utility
Probe Systems and Methods for Testing a Device Under Test
6 May 21
Probe systems and methods for testing a device under test are disclosed herein.
Kazuki Negishi
Filed: 21 Oct 20
Utility
Methods for Maintaining Gap Spacing Between an Optical Probe of a Probe System and an Optical Device of a Device Under Test, and Probe Systems That Perform the Methods
1 Apr 21
Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test and probe systems that perform the methods.
Joseph George Frankel
Filed: 29 Jun 20
Utility
Probe Systems for Optically Probing a Device Under Test and Methods of Operating the Probe Systems
1 Apr 21
Probe systems for optically probing a device under test (DUT) and methods of operating the probe systems.
Joseph George Frankel, Kazuki Negishi, Michael E. Simmons, Eric Robert Christenson, Daniel Rishavy
Filed: 15 Sep 20
Utility
Probe Systems and Methods for Characterizing Optical Coupling Between an Optical Probe of a Probe System and a Calibration Structure
1 Apr 21
Probe systems and methods of characterizing optical coupling between an optical probe of a probe system and a calibration structure.
Joseph George Frankel, Kazuki Negishi
Filed: 22 Sep 20