53 patents
Page 3 of 3
Utility
Probes with fiducial targets, probe systems including the same, and associated methods
28 Dec 20
Probes with fiducial targets, probe systems including the same, and associated methods.
Joseph George Frankel, Koby L. Duckworth, Kazuki Negishi
Filed: 15 Jan 19
Utility
Calibration Chucks for Optical Probe Systems, Optical Probe Systems Including the Calibration Chucks, and Methods of Utilizing the Optical Probe Systems
2 Dec 20
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems.
Kazuki Negishi, Michael E. Simmons, Christopher Anthony Storm, Joseph George Frankel, Eric Robert Christenson, Mario René Berg
Filed: 26 May 20
Utility
Probe on carrier architecture for vertical probe arrays
28 Oct 20
A probe-on-carrier architecture is provided, where several vertical probes are disposed on each probe carrier and the probe carriers are affixed to the space transformer.
Mukesh Selvaraj, January Kister
Filed: 26 Apr 20
Utility
Probe systems and methods for calibrating capacitive height sensing measurements
19 Oct 20
Probe systems and methods for calibrating capacitive height sensing measurements.
Kazuki Negishi, Joseph George Frankel, Eric Robert Christenson
Filed: 29 Dec 19
Utility
Microscopes with Objective Assembly Crash Detection and Methods of Utilizing the Same
29 Jul 20
Microscopes with objective assembly crash detection and methods of utilizing the same are disclosed herein.
Gerald Lee Gisler, Sia Choon Beng, Anthony James Lord, Gavin Neil Fisher
Filed: 23 Jan 20
Utility
Probe Systems and Methods for Calibrating Capacitive Height Sensing Measurements
8 Jul 20
Probe systems and methods for calibrating capacitive height sensing measurements.
Kazuki Negishi, Joseph George Frankel, Eric Robert Christenson
Filed: 29 Dec 19
Utility
Probe systems for testing a device under test
29 Jun 20
Probe systems for testing a device under test are disclosed herein.
Christopher Storm, Michael E. Simmons, Bryan Conrad Bolt, Gavin Neil Fisher, Anthony Lord, Kazuki Negishi
Filed: 26 Sep 18
Utility
Probe systems and methods that utilize a flow-regulating structure for improved collection of an optical image of a device under test
29 Jun 20
Probe systems and methods for collecting an optical image of a device under test (DUT) are disclosed herein.
Michael Teich, Axel Becker
Filed: 18 Jun 19
Utility
Shielding for vertical probe heads
23 Mar 20
Crosstalk between probes in a vertical probe array is reduced by providing a grounded metal carrier disposed between the guide plates of the probe array.
Benjamin N. Eldridge
Filed: 10 Jan 18
Utility
Vertical probe array having a tiled membrane space transformer
2 Mar 20
Vertical probe heads having a space transformer laterally tiled into several sections are provided.
Benjamin N. Eldridge, Masanori Watanabe, Scott Kuhnert, Jeffrey Coussens
Filed: 28 Aug 18
Utility
Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test
24 Feb 20
Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test (DUT).
Daniel Mark Bock, Tim Cleary
Filed: 21 Nov 17
Utility
Probe head with inductance reducing structure
6 Jan 20
Improved impedance matching is provided in vertical probe arrays having conductive guide plates by providing ground pins connecting the guide plates that do not mechanically touch the device under test or the input test apparatus.
Benjamin N. Eldridge, Edin Sijercic, Eric Hill, John Ebner
Filed: 21 Jun 18
Utility
Electrical test probes having decoupled electrical and mechanical design
18 Dec 19
Probes for testing electrical circuits having decoupled electrical and mechanical design are provided.
January Kister, Roy Swart, Edin Sijercic
Filed: 12 Jun 19