241 patents
Page 3 of 13
Utility
Test and measurement devices, systems and methods associated with augmented reality
16 May 23
A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store.
Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
Filed: 30 Nov 21
Utility
Discrete offset dithered waveform averaging for high-fidelity digitization of repetitive signals
16 May 23
Methods and devices for digitizing an analog repetitive signal using waveform averaging are described.
Brandon Walter Buckley, Ryan Douglas Muir, Daniel G. Knierim
Filed: 17 Dec 21
Utility
Reverse Recovery Measurements and Plots
4 May 23
A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive waveform data from the DUT after activation of the DUT by application of power from a power supply, and application of at least a first and second pulse from a source instrument, locate one or more reverse recovery regions in the waveform data, determine a reverse recovery time for the DUT from the reverse recovery region, and display a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display one or more of the reverse recovery regions, and including at least one characteristic for the one or more reverser recovery regions annotated on the reverse recovery plot.
Vivek Shivaram, Niranjan R Hegde, Parjanya Adiga, Krishna N H Sri, Tsuyoshi Miyazaki, Yogesh M. Pai, Venkatraj Melinamane
Filed: 28 Oct 22
Utility
Flexible Wide Bandgap Double Pulse Testing Methodology
4 May 23
A test and measurement instrument has a user interface, one or more probes to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the user interface, at least one of the user inputs to identify at least one analysis to be performed on the DUT, receive waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and second pulse or multiple pulses from a source instrument, perform the at least one analysis on the waveform data, and display the waveform data and analysis on the user interface.
Vivek Shivaram, Niranjan R Hegde, Parjanya Adiga, Krishna N H Sri, Tsuyoshi Miyazaki, Yogesh M. Pai, Venkatraj Melinamane
Filed: 28 Oct 22
Utility
Systems, devices, and methods for measuring direct current/low frequency signal components
25 Apr 23
A test and measurement probe system (100,104), including an input (106) to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit (110), such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output (118) to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument.
Michael J. Mende
Filed: 13 Jul 18
Utility
Noise-compensated jitter measurement instrument and methods
11 Apr 23
A test and measurement device includes an input for receiving a test waveform from a Device Under Test (DUT), where the test waveform has a plurality of input level transitions, a selector structured to respectively and individually extract only those portions of the test waveform that match two or more predefined patterns of input level transitions of the test waveform, a noise compensator structured to individually determine and remove, for each of the extracted portions of the waveform, a component of a jitter measurement caused by random noise of the test and measurement device receiving the test waveform, a summer structured to produce a composite distribution of timing measurements with removed noise components from the extracted portions of the test waveform, and a jitter processor structured to determine a first noise-compensated jitter measurement of the DUT from the composite distribution.
Mark L. Guenther
Filed: 15 Mar 22
Utility
Calibration of magnetic field sensor for current probe
4 Apr 23
A test and measurement instrument for measuring a current in a device under test, comprising an input configured to receive signals from a magnetic field probe; and one or more processors configured to measure, from a signal from the magnetic field probe, a magnetic field generated by a current-carrying conductor of the device under test based on a known current, determine a calibration factor based on the known current and the magnetic field, and generate a calibrated measurement of an unknown current in the current-carrying conductor using a magnetic field generated by the current-carrying conductor based on the unknown current and the calibration factor.
Daniel G. Knierim
Filed: 1 Apr 21
Utility
Frequency converter accessory for a test and measurement instrument
4 Apr 23
An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range.
Daniel G. Knierim, Josiah A. Bartlett, Amr Haj-Omar, Donald J. Dalebroux, Barton T. Hickman, Alexander Krauska
Filed: 16 Nov 20
Utility
System and Method for Developing Machine Learning Models for Testing and Measurement
30 Mar 23
A test and measurement machine learning model development system includes a user interface, one or more ports to allow the system to connect to one or more data sources, one or more memories, and one or more processors configured to execute code to cause the one or more processors to: display on the user interface one or more application user interfaces, the application user interfaces to allow a user to provide user inputs; use and application programming interface to configure the system based on the user inputs; receive data from the one or more data sources; apply one or more modules from a library of signal processing and feature extraction modules to the data to produce training data; apply one or more machine learning models to the training data; provide monitoring of the one or more machine learning models; and save the one or more machine learning models to at least one of the one or more memories.
Mark Anderson Smith, Sunil Mahawar, John J. Pickerd, Sriram K. Mandyam
Filed: 22 Sep 22
Utility
System and Method for Detection of Anomalies In Test and Measurement Results of a Device Under Test (Dut)
23 Mar 23
A test and measurement device has an interface, one or more connectors, each connector to allow the test and measurement device to connect to a test and measurement instrument, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the interface identifying one or more tests to perform on a device under test (DUT); form a connection through one of the one or more connectors to the DUT to perform the one or more tests and receive test result data; apply one or more machine learning models to the test result data to identify potentially anomalous test results; and generate and present a representation of the test result data and the potentially anomalous test results.
Siby Charley Pulikottil, Sriram Mandyam Krishnakumar, Mahesha Guttahalli Lakshmipathy
Filed: 20 Sep 22
Utility
Test and Measurement Instrument with Removable Battery Pack
16 Mar 23
A test system includes a test and measurement instrument having one or more inputs for receiving one or more signals to be measured or tested, a display for outputting measurement results or test results, one or more processors for operating the instrument, a chassis housing the instrument, a power connection to receive power for powering the one or more processors from a wall connection.
Chris A. Valentine, Prashanth Thota, Steve U. Reinhold, Jonathan D. Clem, Timothy Keil
Filed: 14 Sep 22
Utility
Real-equivalent-time Clock Recovery for a Nearly-real-time Real-equivalent-time Oscilloscope
9 Mar 23
A test and measurement device has an input port configured to receive a signal from a device under test, the signal having a symbol rate, one or more analog-to-digital converters to convert the signal to waveform samples at a sampling rate, and one or more processors configured to execute code that, when aliasing is present in the waveform samples, causes the one or more processors to: up-sample the waveform samples to produce up-sampled samples; use the up-sampled samples to produce a real-time waveform; perform clock recovery on the real-time waveform to produce a recovered clock; and resample the waveform samples using the recovered clock to produce a non-aliased waveform.
Kan Tan
Filed: 24 Aug 22
Utility
Low frequency S-parameter measurement
7 Mar 23
A method determines scattering parameters, S-parameters, for a device under test for a first frequency range.
John J. Pickerd, Kan Tan
Filed: 29 May 20
Utility
Parallel Trigger Paths In a Test and Measurement Instrument
23 Feb 23
A test and measurement instrument includes an auxiliary trigger input port for receiving an auxiliary trigger signal, a digital trigger processor for generating a digital trigger signal from the auxiliary trigger signal, an analog trigger processor for generating an analog trigger signal from the auxiliary trigger signal, a user-configurable selector coupled to the digital trigger processor and to the analog trigger processor, the user-configurable selector configured to output either the digital trigger signal or the analog trigger signal as a selected trigger output signal of the instrument.
Joshua J. O'Brien, Jed H. Andrews
Filed: 19 Aug 22
Utility
Digital Twin with Machine Learning Waveform Generation Including Parameter Control for Device Under Test Emulation
23 Feb 23
A device for generating waveforms includes a machine learning system configured to associate waveforms from a device under test to parameters, a user interface configured to allow a user to provide one or more user inputs, and one or more processors configured to execute code that causes the one or more processors to receive one or more inputs through the user interface that include one or more parameters, apply the machine learning system to the received one or more parameters, produce, by the machine learning system, a waveform based on the one or more parameters, and output the produced waveform.
John J. Pickerd, Justin E. Patterson, Heike Tritschler
Filed: 22 Aug 22
Utility
Combined Tdecq Measurement and Transmitter Tuning Using Machine Learning
16 Feb 23
A test and measurement system has a test and measurement instrument, a test automation platform, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive a waveform created by operation of a device under test, generate one or more tensor arrays, apply machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, apply machine learning to a second tensor array of the one of the one or more tensor arrays to produce predicted tuning parameters for the device under test, use the equalizer tap values to produce a Transmitter and Dispersion Eye Closure Quaternary (TDECQ) value, and provide the TDECQ value and the predicted tuning parameters to the test automation platform.
John J. Pickerd, Kan Tan
Filed: 29 Jul 22
Utility
Machine Learning for Taps to Accelerate Tdecq and Other Measurements
16 Feb 23
A test and measurement instrument has an input configured to receive a signal from a device under test, a memory, a user interface to allow the user to input settings for the test and measurement instrument, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to: acquire a waveform representing the signal received from the device under test; generate one or more tensor arrays based on the waveform; apply machine learning to the one or more tensor arrays to produce equalizer tap values; and apply equalization to the waveform using the equalizer tap values to produce an equalized waveform; and perform a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test.
Kan Tan, John J. Pickerd
Filed: 29 Jul 22
Utility
Thermal management system for a test-and-measurement probe
14 Feb 23
A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit.
Julie A. Campbell, David Thomas Engquist, Sam J. Strickling
Filed: 12 Nov 20
Utility
Stand for a Test and Measurement Instrument
19 Jan 23
A stand for receiving a portable test and measurement instrument includes a base plate, a first portion extending orthogonally from the generally flat base, the first portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand, and a second portion adjacent to and extending at an angle from the first portion, the second portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand.
Chris A. Valentine, David M. Ediger, Prashanth Thota
Filed: 26 Sep 22
Utility
Swept Parameter Oscilloscope
19 Jan 23
A test and measurement instrument has a user interface configured to allow a user to provide one or more user inputs, a display to display results to the user, a memory, one or more processors configured to execute code to cause the one or more processors to receive a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recover a clock signal from the waveform array, generate a waveform image for each waveform, render the waveform images into video frames to produce an image array of the video frames, select at least some of the video frames to form a video sequence, and play the video sequence on a display.
John J. Pickerd, Justin E. Patterson
Filed: 11 Jul 22