241 patents
Page 4 of 13
Utility
Multiple Analog-to-digital Converter System to Provide Simultaneous Wide Frequency Range, High Bandwidth, and High Resolution
19 Jan 23
A composite analog-to-digital converter (ADC) has a low resolution ADC configured to receive and digitize analog data, the low resolution ADC having a low resolution and a high operating speed, one or more high resolution ADCs configured to receive and digitize the analog data, the one or more high resolution ADCs having a resolution higher than the low resolution ADC, and an operating speed lower than the high operating speed of the low resolution ADC, a sample clock generator to provide a sample clock signal to the low resolution ADC and to a clock divider, a mixer to receive the analog data and connected to the one or more high resolution ADCs, a local oscillator connected to the mixer to allow the one or more high resolution ADCs to be tuned to sample a portion of a spectrum of the first ADC.
ALEXANDER KRAUSKA
Filed: 12 Jul 22
Utility
Usage-aware Compression for Streaming Data from a Test and Measurement Instrument
12 Jan 23
A test and measurement instrument includes one or more ports including at least one test port configured to couple to one or more devices under test, a user interface to receive one or more user inputs, an acquisition memory to store waveform data acquired from the one or more devices under test, one or more processors configured to execute code that causes the one or more processors to: receive an input through the user interface; determine one or more requested data types based on the input; transform the waveform data into compressed data containing only data elements corresponding to the one or more requested data types; and transmit the compressed data to a client.
Keith D. Rule
Filed: 7 Jul 22
Utility
Event activity trigger
10 Jan 23
Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events.
Patrick A. Smith, Daniel G. Knierim
Filed: 6 Jun 20
Utility
System and Method for Computing Direct Quadrature Zero Resultant Drive Vector Using Rotor Position
29 Dec 22
A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals.
Parjanya Adiga, Niranjan R. Hegde, Krishna N H. Sri, Gary J. Waldo, Yogesh M. Pai
Filed: 24 Jun 22
Utility
Multiple Sample-rate Data Converter
22 Dec 22
A test and measurement instrument includes a first data channel including a first data converter operating at a first rate, and a second data channel including a second data converter operating at a second rate that is different than the first rate.
Joshua J. O'Brien, Timothy E. Bieber, Barton T. Hickman
Filed: 21 Jun 22
Utility
System for test and measurement instrumentation data collection and exchange
20 Dec 22
A method of capturing instrument data using a communications device includes sending an actuation signal to a camera to take a photograph of at least one instrument, one of either transmitting or receiving a trigger message between the communications device and the at least one instrument, storing the photograph in a memory on the communications device, determining associated information for the photograph, and transmitting the photograph, associated information and user information to a network.
Frederick B. Kuhlman, III, Shane L. Arnold
Filed: 26 Nov 19
Utility
Multi-input Remote Heads for Sequential Testing
8 Dec 22
An input selector for electrically connecting one of a plurality of test signals from a device under test to a test and measurement instrument includes a multiplexer having multiple inputs, each of the multiple inputs coupled to a different one of the plurality of test signals from the device under test, and having an output of a selected one of the multiple inputs, and an amplifier coupled to the output of the multiplexer for amplifying the selected test signal of the device under test before being sent as an output of the input selector to the test and measurement instrument.
Shane A. Hazzard, Ajaiey Kumar Sharma, Timothy E. Bieber, John Marrinan, Andrew McCann, Pieter Christiaan Seidel, Josiah A. Bartlett
Filed: 3 Jun 22
Utility
General Digital Signal Processing Waveform Machine Learning Control Application
8 Dec 22
A test and measurement system includes a machine learning system configured to communicate with a test automation system, a user interface configured to allow a user to provide one or more user inputs and to provide results to the user, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used to configure the machine learning system, receive a waveform created by operation of a device under test, apply the configured machine learning system to analyze the waveform, and provide an output of predicted metadata about the waveform.
John J. Pickerd, Mark Anderson Smith, Kan Tan, Evan Douglas Smith, Justin E. Patterson, Heike Tritschler
Filed: 2 Jun 22
Utility
Explicit Solution for Dfe Optimization with Constraints
8 Dec 22
A method of equalizing a communication link includes setting a number of coefficients equal to a required number of coefficients, determining a number of pulse responses for a waveform, the number of pulse responses being greater than the number of coefficients, setting all values in a set of values to zero, the set of values having a number of values equal to the number of coefficients, repeating, until all values in the set of values have been assigned, determining a current lowest parameter in a set of given parameters, using a position of the current lowest parameter in the set of given parameters as an index, determining a minimum value between a first term in the set of given parameters multiplied by a main pulse response minus a summation of each parameter in the set of parameters multiplied by each value in the set of values, divided by the current lowest parameter, and a corresponding pulse response, and assigning the minimum value to the value in the set of values having a position equal to position of the current lowest parameter, and determining a value of each coefficient in a set of coefficients by multiplying each value in the set of values with the sign of a corresponding pulse response in the number of pulse responses; defining an equalizer having a number of taps equal to the number of coefficients, each tap having a value based on the corresponding coefficient; and applying the equalizer to a waveform received through the communication link to produce an equalized waveform.
Kan Tan
Filed: 26 May 22
Utility
Automated assisted circuit validation
6 Dec 22
A method comprising categorizing nodes of a fabricated circuit as being priority nodes and nodes as being inferior nodes; evaluating a first priority node by automatically designating for verification the first priority node, and ascertaining whether a measured signal from the first priority node meets a pass-fail criterion for the first priority node; evaluating, when the measured signal from the first priority node meets the pass-fail criterion, a second priority node by automatically designating for verification the second priority node, and ascertaining whether a measured signal from the second priority node meets a pass-fail criterion for the second priority node; and evaluating, when the measured signal from the first priority node does not meet the pass-fail criterion, a first inferior node, by automatically designating for verification the first inferior node, and ascertaining whether a measured signal from the first inferior node meets a pass-fail criterion for the first inferior node.
David Everett Burgess
Filed: 8 Jul 21
Utility
Bit Error Ratio Estimation Using Machine Learning
24 Nov 22
A test and measurement system includes a machine learning system, a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: acquire a waveform from the device under test (DUT),transform the waveform into a composite waveform image, and send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT.
Maria Agoston, John J. Pickerd, Kan Tan
Filed: 16 May 22
Utility
Short Pattern Waveform Database Based Machine Learning for Measurement
24 Nov 22
A test and measurement system includes a test and measurement device configured to receive a signal from a device under test, and one or more processors configured to execute code that causes the one or more processors to generate a waveform from the signal, apply an equalizer to the waveform, receive an input identifying one or more measurements to be made on the waveform, select a number of unit intervals (UIs) for a known data pattern, scan the waveform for the known data patterns having a length of the number of UIs, identify the known data patterns as short pattern waveforms, apply a machine learning system to the short pattern waveforms to obtain a value for the one or more measurements, and provide the values of the one or more measurements for the waveform.
Kan Tan, John J. Pickerd
Filed: 18 May 22
Utility
Real-equivalent-time Oscilloscope with Time Domain Reflectometer
10 Nov 22
A test and measurement device includes one or more ports configured to connect to a device under test (DUT), a time domain reflectometry (TDR) source configured receive a source control signal and to produce an incident signal to be applied to the DUT, one or more analog-to-digital converters (ADC) configured to receive a sample clock and sample the incident signal from the TDR source and a time domain reflection (TDR) signal or a time domain transmission (TDT) signal from the DUT to produce an incident waveform and a TDR/TDT waveform, one or more processors configured to execute code to cause the one or more processors to: control a clock synthesizer to produce the sample clock and the source control signal, and use a period of the TDR source, a period of the sample clock, and the number of samples to determine time locations for samples in the incident waveform and the TDR/TDT waveform, and a display configured to display the incident waveform and the TDR/TDT waveform.
Kan Tan
Filed: 2 May 22
Utility
Isolated Probe Tip
3 Nov 22
A probe tip for an isolated probe having a triaxial cable has a conductive probe tip interface at one end of the cable, a signal conductor, the signal conductor traversing a length of the cable and electrically connected to the conductive probe tip interface, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor at least along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the probe tip, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor.
Daniel G. Knierim, Josiah A. Bartlett, Andrew W. Rusinek, David Thomas Engquist
Filed: 26 Apr 22
Utility
Multi-mode Measurement Probe
20 Oct 22
A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal.
Joshua J. O'Brien, Josiah A. Bartlett
Filed: 14 Apr 22
Utility
Real-equivalent-time Flash Array Digitizer Oscilloscope Architecture
20 Oct 22
A test and measurement system includes a clock recovery circuit configured to receive a signal from a device under test and to produce a pattern trigger signal, a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing the signal received from the device under test, a row selection circuit configured to select a row in the array of counters, and a ring counter circuit configured to receive a clock signal, select a column in the array of counters, produce end of row signals, and produce a fill complete signal upon all of the columns having been swept, the fill complete signal indicating completion of the waveform image, an equivalent time sweep logic circuit configured to receive the pattern trigger signal and the end of row signals from the ring counter and to produce the clock signal with a delay to increment a clock delay to the ring counter until the fill complete signal is received, and a machine learning system configured to receive the waveform image and provide operating parameters for the device under test.
John J. Pickerd, Kan Tan, Heike Tritschler, Evan Douglas Smith, Williams Fabricio Flores Yepez
Filed: 19 Apr 22
Utility
Precision, High Bandwidth, Switching Attenuator
13 Oct 22
An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.
JULIE A. CAMPBELL, DANIEL G. KNIERIM, BARTON T. HICKMAN
Filed: 8 Apr 22
Utility
Test Monitor Including Signal Separator and Data Recorder
13 Oct 22
A test monitor extracts waveforms from a differential transmission line of an automobile network without disrupting the differential transmission line, and stores the data decoded from the extracted waveforms.
K T Anurag, Darshan Mehta, P E Ramesh
Filed: 6 Apr 22
Utility
Calibration of Magnetic Field Sensor for Current Probe
6 Oct 22
A test and measurement instrument for measuring a current in a device under test, comprising an input configured to receive signals from a magnetic field probe; and one or more processors configured to measure, from a signal from the magnetic field probe, a magnetic field generated by a current-carrying conductor of the device under test based on a known current, determine a calibration factor based on the known current and the magnetic field, and generate a calibrated measurement of an unknown current in the current-carrying conductor using a magnetic field generated by the current-carrying conductor based on the unknown current and the calibration factor.
Daniel G. Knierim
Filed: 1 Apr 21
Utility
Test and Measurement Instrument Having Programmable Acquisition History
29 Sep 22
A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal and store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the selected acquisition in the data store against one or more criteria, and identify whether the acquisition meets the one or more criteria.
Gary J. Waldo
Filed: 22 Mar 22