144 patents
Utility
Test and Measurement System for Analyzing Devices Under Test
4 Jan 24
A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
Sam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen
Filed: 14 Sep 23
Utility
Combined Shunt and Multi-segmented Rogowski-coil Current Sensor
28 Dec 23
A current sensor configured to measure current in a current-carrying conductor.
Josiah A. Bartlett, Daniel G. Knierim, David L. Knierim
Filed: 22 Aug 23
Utility
Analog Signal Isolator
21 Dec 23
Disclosed is a signal isolating test instrument, such as an electronics test probe.
Jonathan S. Dandy, Daniel G. Knierim
Filed: 29 Aug 23
Utility
Separating Noise to Increase Machine Learning Prediction Accuracy In a Test and Measurement System
21 Dec 23
A test and measurement instrument has an input port to allow the instrument to receive one or more waveforms from a device under test (DUT), one or more low pass filters to remove a portion of the noise from the one or more waveforms, and one or more processors to: select a waveform pattern from the waveforms, measure noise in the one or more waveforms and generate a noise representation of the noise removed, create one or more images using the waveform pattern and the one or more filtered waveforms, add the noise representation to the one or more images to produce at least one combined image, input the at least one combined image to one or more deep learning networks, and receive one or more predicted values for the DUT.
John J. Pickerd, Kan Tan
Filed: 12 Jun 23
Utility
Oscilloscope Having a Principal Component Analyzer
21 Dec 23
A system includes an input for accepting an input signal from a Device Under Test (DUT), a measurement unit for generating first measurement data and second measurement data from the input signal, and one or more processors configured to derive at least one principal component from the first and second measurement data using principal component analysis, and remap the first measurement data and the second measurement data to a principal component domain derived from the at least one principal component.
Justin E. Patterson
Filed: 13 Jun 23
Utility
Machine Learning for Measurement Using Linear Response Extracted from Waveform
21 Dec 23
A test and measurement instrument has one or more ports configured to receive a signal one or more devices under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: acquire a waveform from the signal, derive a pattern waveform from the waveform, perform linear response extraction on the pattern waveform, present one or more data representations including a data representation of the extracted linear response to a machine learning system, and receive a prediction for a measurement from the machine learning system.
Kan Tan, John J. Pickerd
Filed: 15 Jun 23
Utility
Generating Test Data Using Principal Component Analysis
21 Dec 23
A system includes an input for accepting a dataset including at least two sets of data in a dataset domain and one or more processors configured to derive at least two principal components from the dataset using principal component analysis, the at least two principal components being orthogonal to one another, map the dataset to a principal component domain derived from the at least two principal components, generate additional data in the principal component domain, and remap the additional data in the principal component domain back to the dataset domain as a newly generated dataset.
Justin E. Patterson, Kan Tan
Filed: 19 Jun 23
Utility
Automated Cavity Filter Tuning Using Machine Learning
14 Dec 23
A test and measurement instrument includes one or more ports to connect to one or more devices under test (DUT) having tuning screws, and to a robot, one or more processors to configured to: send commands to the robot to position the tuning screws on the one or more DUTs to one or more sets of positions, each set of positions being a parameter set for the tuning screws, acquire a set of operating parameters for each parameter set from the one or more DUTs, generate a parameter set image for each set, create a combined image of the parameter set images, provide the combined image to a machine learning system to obtain a predicted set of values, adjust the predicted set of values to produce a set of predicted positions, send commands to the robot to position the tuning screws to positions in the set of predicted positions, obtain a set of tuned operating parameters from the one or more DUTs, and validate operation of the one or more DUTs.
John J. Pickerd, Ajaiey Kumar Sharma, Kan Tan
Filed: 19 May 23
Utility
Shunt for Use In Busbar-to-module Connections
23 Nov 23
A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt.
Daniel G. Knierim, Julie A. Campbell, David M. Ediger
Filed: 17 May 23
Utility
Transmitter Equalizer Tap Extraction
16 Nov 23
A test and measurement instrument has one or more input ports to connect the instrument to a device under test (DUT), one or more processors configured to execute code to cause the one or more processors to: receive an equalized waveform and an un-equalized waveform through the input port from the DUT, without any knowledge of a digital pattern that corresponds to the waveforms and without extracting the digital pattern from the waveforms, align the un-equalized waveform and the equalized waveform in time to produce an aligned un-equalized waveform and an aligned equalized waveform, and use the aligned equalized waveform and the aligned un-equalized waveform to determine equalizer tap values.
Kan Tan
Filed: 30 Apr 23
Utility
Device and Method for Waveform Searching by Example
19 Oct 23
A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions.
Lance H. Forsberg, Keith D. Rule, David N. Wyban
Filed: 14 Apr 23
Utility
Semi-automated Oscilloscope Noise Compensation Based on Power Spectral Density Characterization
12 Oct 23
A method of dynamically determining an oscilloscope noise characteristic includes retrieving a power spectral density (PSD) model of noise from a storage based upon a current configuration of the oscilloscope, generating a representation of any filtering being applied to a waveform generated by a device under test, using the PSD and the representation to produce a modified power spectral density, and using the modified power spectral density to determine a dynamic oscilloscope noise characteristic.
Mark L. Guenther, Pavel R. Zivny
Filed: 14 Mar 23
Utility
Tuning a Device Under Test Using Parallel Pipeline Machine Learning Assistance
5 Oct 23
A test system has ovens configured to hold devices under test (DUTs), DUT switches, each connected to the DUTs in an oven, splitters, each splitter connected to a DUT switch, an instrument switch connected to one output of each splitter, the other output of each splitter connected to a test instrument, and one or more processors to control the instrument switch to select one of the DUT switches connected to an oven, control the selected DUT switch to connect each DUT in the oven to a channel of the test and measurement instrument, use machine learning to tune the DUT to a set of parameters until the DUT passes or fails, repeat the connecting, tuning, and testing of each DUT until all DUTs in an oven have been tested, and repeat the selection and control of the DUT switches until each DUT in each oven has been tuned and tested.
John J. Pickerd
Filed: 24 Mar 23
Utility
Seamless Spectrograms In a Multi-channel Test and Measurement Instrument
17 Aug 23
A test and measurement instrument includes a first channel input for accepting a first input signal, a second channel input for accepting a second input signal, a spectrogram processor for producing a first spectrogram from the first input signal and for producing a second spectrogram from the second input signal, and a display for simultaneously showing the first spectrogram and the second spectrogram.
Gary J. Waldo
Filed: 10 Feb 23
Utility
Method and Apparatus for Measuring Power Supply Induced Jitter
10 Aug 23
A test and measurement instrument includes components and methods for measuring noise at an output of a power supply, measuring jitter of a serial data signal produced by a data generating circuit coupled to the power supply and correlating the noise measured from the power supply to the jitter of the serial data signal.
Madhusudan Acharya, Yogesh M. Pai, Krishna N H Sri, Anthony B. Ambrose, Blair Battye, Dallas J. Mohler
Filed: 3 Feb 23
Utility
Interface Mechanism to Control and Access Instrument Settings and Instrument Data
27 Jul 23
A test and measurement system includes an instrument having an input port structured to receive an input signal from a Device Under Test (DUT), a memory structured to store data derived from the input signal, a remote access manager, and an instrument state manager structured to maintain a present operating state of the instrument.
K T Anurag, Nitin Khaneja, Akshay Mishra, K Vani
Filed: 23 Jan 23
Utility
Machine Learning Model Training Using De-noised Data and Model Prediction with Noise Correction
20 Jul 23
A test and measurement system has one or more inputs connectable to a device under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: gather a set of training waveforms by acquiring one or more waveforms from one or more DUTs or from simulated waveforms, remove noise from the set of training waveforms to produce a set of noiseless training waveforms, and use the set of noiseless training waveforms as a training set to train a neural network to predict a measurement value for a DUT, producing a trained neural network.
Wenzheng Sun, Pavel R. Zivny
Filed: 9 Jan 23
Utility
Systems and Methods for Machine Learning Model Training and Deployment
13 Jul 23
A system to develop and test machine learning models has a waveform emulator machine learning system, a user interface to allow a user to input one or more design parameters for the waveform emulator machine learning system, one or more processors configured to execute code to cause the one or more processors to: send the one or more design parameters to the waveform emulator machine learning system; receive one or more data sets from the waveform emulator machine learning system, the one or more data sets based on the one or more design parameters; train a developed machine learning model using at least one of the one or more data sets, resulting in a trained machine learning model; validate the trained machine learning model using a previously unused one of the one or more data sets; adjust the trained machine learning model as needed; and repeat the training, validating, and adjusting until an optimal machine learning model is trained.
Wenzheng Sun, Xiaolan Wang, Justin E. Patterson
Filed: 14 Dec 22
Utility
Laminated Structure for Thermal Conduction In a Flexible Electrical Substrate
13 Jul 23
A structure has a flexible thermally conductive material having an adhesive surface and a non-adhesive surface, and a thermally conductive adhesive adhered to the adhesive surface of the flexible thermally conductive material leaving the non-adhesive surface exposed to an atmosphere in which the structure resides.
Julie A. Campbell
Filed: 30 Nov 22
Utility
Automatic Determination of Spectrum and Spectrogram Attributes In a Test and Measurement Instrument
13 Jul 23
A test and measurement instrument includes a spectrogram generator for producing a first spectrogram image from an input signal, a display for showing the spectrogram image, and a user interface operating in conjunction with the display, the user interface including one or more user controllable inputs and the user interface configured to detect a user action, where the spectrogram generator is structured to produce a second spectrogram image, different from the first spectrogram image, based on the detected user action by the user interface.
Gary J. Waldo, Alan Edward Wolke, Barton T. Hickman
Filed: 30 Nov 22