144 patents
Page 3 of 8
Utility
Multi-input Remote Heads for Sequential Testing
8 Dec 22
An input selector for electrically connecting one of a plurality of test signals from a device under test to a test and measurement instrument includes a multiplexer having multiple inputs, each of the multiple inputs coupled to a different one of the plurality of test signals from the device under test, and having an output of a selected one of the multiple inputs, and an amplifier coupled to the output of the multiplexer for amplifying the selected test signal of the device under test before being sent as an output of the input selector to the test and measurement instrument.
Shane A. Hazzard, Ajaiey Kumar Sharma, Timothy E. Bieber, John Marrinan, Andrew McCann, Pieter Christiaan Seidel, Josiah A. Bartlett
Filed: 3 Jun 22
Utility
Explicit Solution for Dfe Optimization with Constraints
8 Dec 22
A method of equalizing a communication link includes setting a number of coefficients equal to a required number of coefficients, determining a number of pulse responses for a waveform, the number of pulse responses being greater than the number of coefficients, setting all values in a set of values to zero, the set of values having a number of values equal to the number of coefficients, repeating, until all values in the set of values have been assigned, determining a current lowest parameter in a set of given parameters, using a position of the current lowest parameter in the set of given parameters as an index, determining a minimum value between a first term in the set of given parameters multiplied by a main pulse response minus a summation of each parameter in the set of parameters multiplied by each value in the set of values, divided by the current lowest parameter, and a corresponding pulse response, and assigning the minimum value to the value in the set of values having a position equal to position of the current lowest parameter, and determining a value of each coefficient in a set of coefficients by multiplying each value in the set of values with the sign of a corresponding pulse response in the number of pulse responses; defining an equalizer having a number of taps equal to the number of coefficients, each tap having a value based on the corresponding coefficient; and applying the equalizer to a waveform received through the communication link to produce an equalized waveform.
Kan Tan
Filed: 26 May 22
Utility
Short Pattern Waveform Database Based Machine Learning for Measurement
24 Nov 22
A test and measurement system includes a test and measurement device configured to receive a signal from a device under test, and one or more processors configured to execute code that causes the one or more processors to generate a waveform from the signal, apply an equalizer to the waveform, receive an input identifying one or more measurements to be made on the waveform, select a number of unit intervals (UIs) for a known data pattern, scan the waveform for the known data patterns having a length of the number of UIs, identify the known data patterns as short pattern waveforms, apply a machine learning system to the short pattern waveforms to obtain a value for the one or more measurements, and provide the values of the one or more measurements for the waveform.
Kan Tan, John J. Pickerd
Filed: 18 May 22
Utility
Bit Error Ratio Estimation Using Machine Learning
24 Nov 22
A test and measurement system includes a machine learning system, a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: acquire a waveform from the device under test (DUT),transform the waveform into a composite waveform image, and send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT.
Maria Agoston, John J. Pickerd, Kan Tan
Filed: 16 May 22
Utility
Real-equivalent-time Oscilloscope with Time Domain Reflectometer
10 Nov 22
A test and measurement device includes one or more ports configured to connect to a device under test (DUT), a time domain reflectometry (TDR) source configured receive a source control signal and to produce an incident signal to be applied to the DUT, one or more analog-to-digital converters (ADC) configured to receive a sample clock and sample the incident signal from the TDR source and a time domain reflection (TDR) signal or a time domain transmission (TDT) signal from the DUT to produce an incident waveform and a TDR/TDT waveform, one or more processors configured to execute code to cause the one or more processors to: control a clock synthesizer to produce the sample clock and the source control signal, and use a period of the TDR source, a period of the sample clock, and the number of samples to determine time locations for samples in the incident waveform and the TDR/TDT waveform, and a display configured to display the incident waveform and the TDR/TDT waveform.
Kan Tan
Filed: 2 May 22
Utility
Isolated Probe Tip
3 Nov 22
A probe tip for an isolated probe having a triaxial cable has a conductive probe tip interface at one end of the cable, a signal conductor, the signal conductor traversing a length of the cable and electrically connected to the conductive probe tip interface, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor at least along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the probe tip, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor.
Daniel G. Knierim, Josiah A. Bartlett, Andrew W. Rusinek, David Thomas Engquist
Filed: 26 Apr 22
Utility
Multi-mode Measurement Probe
20 Oct 22
A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal.
Joshua J. O'Brien, Josiah A. Bartlett
Filed: 14 Apr 22
Utility
Real-equivalent-time Flash Array Digitizer Oscilloscope Architecture
20 Oct 22
A test and measurement system includes a clock recovery circuit configured to receive a signal from a device under test and to produce a pattern trigger signal, a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing the signal received from the device under test, a row selection circuit configured to select a row in the array of counters, and a ring counter circuit configured to receive a clock signal, select a column in the array of counters, produce end of row signals, and produce a fill complete signal upon all of the columns having been swept, the fill complete signal indicating completion of the waveform image, an equivalent time sweep logic circuit configured to receive the pattern trigger signal and the end of row signals from the ring counter and to produce the clock signal with a delay to increment a clock delay to the ring counter until the fill complete signal is received, and a machine learning system configured to receive the waveform image and provide operating parameters for the device under test.
John J. Pickerd, Kan Tan, Heike Tritschler, Evan Douglas Smith, Williams Fabricio Flores Yepez
Filed: 19 Apr 22
Utility
Precision, High Bandwidth, Switching Attenuator
13 Oct 22
An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.
JULIE A. CAMPBELL, DANIEL G. KNIERIM, BARTON T. HICKMAN
Filed: 8 Apr 22
Utility
Test Monitor Including Signal Separator and Data Recorder
13 Oct 22
A test monitor extracts waveforms from a differential transmission line of an automobile network without disrupting the differential transmission line, and stores the data decoded from the extracted waveforms.
K T Anurag, Darshan Mehta, P E Ramesh
Filed: 6 Apr 22
Utility
Calibration of Magnetic Field Sensor for Current Probe
6 Oct 22
A test and measurement instrument for measuring a current in a device under test, comprising an input configured to receive signals from a magnetic field probe; and one or more processors configured to measure, from a signal from the magnetic field probe, a magnetic field generated by a current-carrying conductor of the device under test based on a known current, determine a calibration factor based on the known current and the magnetic field, and generate a calibrated measurement of an unknown current in the current-carrying conductor using a magnetic field generated by the current-carrying conductor based on the unknown current and the calibration factor.
Daniel G. Knierim
Filed: 1 Apr 21
Utility
Test and Measurement Instrument Having Programmable Acquisition History
29 Sep 22
A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal and store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the selected acquisition in the data store against one or more criteria, and identify whether the acquisition meets the one or more criteria.
Gary J. Waldo
Filed: 22 Mar 22
Utility
Test and Measurement Instrument Having Programmable Acquisition History Storage and Restore
29 Sep 22
A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal, store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the acquisition in the data store to one or more criteria, and identify whether the compared acquisition meets the one or more criteria.
Gary J. Waldo
Filed: 22 Mar 22
Utility
Optical Transceiver Tuning Using Machine Learning
29 Sep 22
A test and measurement device has a connection to allow the test and measurement device to connect to an optical transceiver, one or more processors, configured to execute code that causes the one or more processors to: initially set operating parameters for the optical transceiver to average parameters, acquire a waveform from the optical transceiver, measure the acquired waveform and determine if operation of the transceiver passes or fails, send the waveform and the operating parameters to a machine learning system to obtain estimated parameters if the transceiver fails, adjust the operating parameters based upon the estimated parameters, and repeat the acquiring, measuring, sending, and adjusting as needed until the transceiver passes.
Evan Douglas Smith, John J. Pickerd, Williams Fabricio Flores Yepez, Heike Tritschler
Filed: 22 Mar 22
Utility
Optical Transmitter Tuning Using Machine Learning and Reference Parameters
29 Sep 22
A test and measurement system includes a test and measurement device, a connection to allow the test and measurement device to connect to an optical transceiver, and one or more processors, configured to execute code that causes the one or more processors to: set operating parameters for the optical transceiver to reference operating parameters; acquire a waveform from the optical transceiver; repeatedly execute the code to cause the one or more processors to set operating parameters and acquire a waveform, for each of a predetermined number of sets of reference operating parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted operating parameters; set the operating parameters for the optical transceiver to the predicted operating parameters; and test the optical transceiver using the predicted operating parameters.
John J. Pickerd, Kan Tan, Evan Douglas Smith, Heike Tritschler
Filed: 22 Mar 22
Utility
Noise-compensated Jitter Measurement Instrument and Methods
22 Sep 22
A test and measurement device includes an input for receiving a test waveform from a Device Under Test (DUT), where the test waveform has a plurality of input level transitions, a selector structured to respectively and individually extract only those portions of the test waveform that match two or more predefined patterns of input level transitions of the test waveform, a noise compensator structured to individually determine and remove, for each of the extracted portions of the waveform, a component of a jitter measurement caused by random noise of the test and measurement device receiving the test waveform, a summer structured to produce a composite distribution of timing measurements with removed noise components from the extracted portions of the test waveform, and a jitter processor structured to determine a first noise-compensated jitter measurement of the DUT from the composite distribution.
Mark L. Guenther
Filed: 15 Mar 22
Utility
Test and Measurement System
25 Aug 22
A test and measurement system includes a primary instrument having an input for receiving a test signal for measurement or analysis from a Device Under Test (DUT) and generating a test waveform from the test signal, and a duplicator for sending a copy of the test waveform to one or more secondary instruments.
John J. Pickerd, Keith D. Rule, Mark Anderson Smith
Filed: 25 Feb 22
Utility
Eye Classes Separator with Overlay, and Composite, and Dynamic Eye-trigger for Humans and Machine Learning
4 Aug 22
A system for generating images on a test and measurement device includes a first input for accepting a waveform input signal carrying sequential digital information and an image generator structured to generate a visual image using a segment of the waveform input only when two or more sequential codes of digital information match sequential codes carried in the sequential digital information of the segment of the waveform input.
John J. Pickerd, Kan Tan
Filed: 3 Feb 22
Utility
Fast Stressed-eye Calibration for Receiving Testing
23 Jun 22
A method of generating a calibration signal includes setting a first parameter to an initial first value and a second parameter to an initial second value, generating an initial eye diagram using the initial first value and the initial second value, determining a first difference between a first dimension of the initial eye diagram and a target first dimension, and a second difference between a second dimension of the initial eye diagram and a second target dimension, estimating a next first value to cause the first difference to be zero, setting the first parameter to the next first value, generating a next eye diagram, repeating the estimating, setting, and generating until the first dimension of a most recent next eye diagram is within the first target dimension, setting a final first parameter value to a most recent next first value, setting a final second parameter value to the initial second value when the second dimension of the most recent next eye diagram is within the second target dimension, generating a calibration signal in accordance with the final first parameter value and the final second parameter value.
Subhankar Ghose, Ankit Dash, David M. Bouse
Filed: 13 Dec 21
Utility
Test and Measurement Devices, Systems and Methods Associated with Augmented Reality
23 Jun 22
A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store.
Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
Filed: 30 Nov 21