144 patents
Page 4 of 8
Utility
Phased Array Over the Air Testing
2 Jun 22
A test and measurement system includes a test and measurement device having input channels, a reference array of antennas connected to the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive a first signal from a phased array of antennas connected to a device under test directed at a first side of the reference array, receive a second signal from the phased array of antennas connected to the device under test directed at a second side of the reference array, without moving the device under test, the phased array, or the reference array.
Donald J. Dalebroux, Amr Haj-Omar
Filed: 2 Dec 21
Utility
Systems, Methods, and Devices for High-speed Input/output Margin Testing
26 May 22
A margin testing device includes at least one interface structured to connect to a device under test (DUT) one or more controllers structured to create a set of test signals based on a sequence of pseudo random data and one or more pre-defined parameters, and an output structured to send the set of test signals to the DUT.
Daniel S. Froelich, Sam J. Strickling
Filed: 23 Nov 21
Utility
Systems, Methods, and Devices for High-speed Input/output Margin Testing
26 May 22
A system for data creation, storage, analysis, and training while margin testing includes a margin test generator coupled through an interface to a Device Under Test (DUT).
Daniel S. Froelich, Sam J. Strickling
Filed: 23 Nov 21
Utility
Automatic Recommendation of Feature Upgrades In a Test and Measurement Instrument
12 May 22
A test and measurement instrument includes a system and/or method to generate a recommendation of a feature upgrade to the instrument.
Joshua J. O'Brien
Filed: 29 Oct 21
Utility
Multi-user Test Instrument
5 May 22
A test and measurement instrument includes one or more processors to execute code to cause the processors to: access a user instance of the test and measurement instrument; receive one or more requests from the user instance of the test and measurement instrument; determine any collisions between the one or more requests and any other requests for elements of the test and measurement instrument; resolve any collisions as necessary; perform one or more operations to fulfill the request; and display information resulting from the one or more operations on an instance user interface.
Josiah A. Bartlett
Filed: 29 Oct 21
Utility
Multi-segmented Rogowski-coil Current Sensor
31 Mar 22
A current sensor configured to measure current in a current-carrying conductor.
Josiah A. Bartlett
Filed: 17 Sep 21
Utility
Synchronization of Unstable Signal Sources for Use In a Phase Stable Instrument
31 Mar 22
A vector network analyzer (VNA) can include a control processor, a receiver coupled with the control processor, switching circuitry coupled with the receiver, a radio frequency (RF) bridge coupled with the switching circuitry, a transmission line coupled with the RF bridge, wherein the transmission line is configured to be coupled with a load; and a signal generator coupled with the RF bridge.
Alexander Krauska
Filed: 10 Dec 21
Utility
Margin Test Data Tagging and Predictive Expected Margins
24 Mar 22
A margin tester including an identification reader configured to receive an adaptor identifier of an adaptor, an interface configured to connect to a device under test through the adaptor, and one or more processors configured to assess a margin, such as an electrical margin or an optical margin, of a device under test and tag the assessment with the adaptor identifier.
Sam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen
Filed: 13 Aug 21
Utility
Mono Channel Burst Classification Using Machine Learning
3 Feb 22
A system an input to receive a waveform signal, and one or more processors configured to execute code to cause the one or more processors to extract data bursts from the waveform signal, generate corresponding data vectors from the raw data for each data burst, and use machine learning to classify each data burst from the corresponding data vector.
Karthikeyan R, Siby Charley P, John J. Pickerd, Saifee Jasdanwala, Chandra Sekhar Kappagantu, Mahesh Nair M
Filed: 27 Jul 21
Utility
Cable Condition Indicator
3 Feb 22
A cable structured to be repeatedly connected to a device, each repeated connection causing degradation of the cable, the cable including a condition indicator disposed on the cable and configured to be updated with each successive connection of the cable into the device.
Sam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen
Filed: 27 Jul 21
Utility
Multiplexer-enabled Cables and Test Fixtures
3 Feb 22
A calibrated test and measurement cable for connecting one or more devices under test and a test and measurement instrument, including a first port structured to electrically connect to a first signal lane, a second port structured to electrically connect to a second signal lane, a third port structured to electrically connect to a test and measurement instrument, and a multiplexer configured to switch between electrically connecting the first port to the third port and connected the second port to the third port.
Sam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen, Shane A. Hazzard
Filed: 14 Jul 21
Utility
Indicating a Probing Target for a Fabricated Electronic Circuit
27 Jan 22
A method for indicating a probing target for a fabricated electronic circuit including: generating an electronic, three-dimensional model based on manufacturing layout information of a fabricated circuit; obtaining, with a vision system, visual environment information for the fabricated circuit; scaling and orienting the three-dimensional model by a scaler and mapper based on the visual environment information; overlaying the three-dimensional model with the visual environment information to produce a correlated image; obtaining an identification of a desired network node of the fabricated circuit; and indicating a probing target, the probing target corresponding to the desired network node of the fabricated circuit.
David Everett Burgess
Filed: 8 Jul 21
Utility
Test and Measurement Instrument Accessory with Reconfigurable Processing Component
20 Jan 22
A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device.
Charles W. Case, Daniel G. Knierim, Joshua J. O'Brien, Josiah A. Bartlett, Julie A. Campbell
Filed: 19 Jul 21
Utility
Securing a Probe to a Device Under Test
13 Jan 22
A method of securing a probe tip to a device under test (DUT), the method comprising: positioning the probe tip near a test point of the DUT, the probe tip comprising a connection point on a signal-path portion of the probe tip and an attachment tab, the connection point making an electrical connection with the test point of the DUT, the attachment tab extending away from the signal-path portion of the probe tip; applying an adhesive to the DUT through a hole in the attachment tab of the probe tip; and curing the adhesive to secure the probe tip to the DUT.
Julie A. Campbell
Filed: 4 Jun 21
Utility
Automated Assisted Circuit Validation
13 Jan 22
A method comprising categorizing nodes of a fabricated circuit as being priority nodes and nodes as being inferior nodes; evaluating a first priority node by automatically designating for verification the first priority node, and ascertaining whether a measured signal from the first priority node meets a pass-fail criterion for the first priority node; evaluating, when the measured signal from the first priority node meets the pass-fail criterion, a second priority node by automatically designating for verification the second priority node, and ascertaining whether a measured signal from the second priority node meets a pass-fail criterion for the second priority node; and evaluating, when the measured signal from the first priority node does not meet the pass-fail criterion, a first inferior node, by automatically designating for verification the first inferior node, and ascertaining whether a measured signal from the first inferior node meets a pass-fail criterion for the first inferior node.
David Everett Burgess
Filed: 8 Jul 21
Utility
Electronic Signal Verification Using a Translated Simulated Waveform
13 Jan 22
A system for verifying signals in electronic circuits that includes a waveform translator and a test-and-measurement instrument.
David Everett Burgess
Filed: 8 Jul 21
Utility
Systems, Methods and Devices for High-speed Input/output Margin Testing
30 Dec 21
Systems, devices and methods for high-speed I/O margin testing can screen high volumes of pre-production and production parts and identify cases where the electrical characteristics have changed enough to impact operation.
Sam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen
Filed: 9 Sep 21
Utility
Test and Measurement System for Analyzing Devices Under Test
30 Dec 21
A test and measurement system for analyzing a device under test, including a database configured to store test results related to tests performed with one or more prior devices under test, a receiver to receive new test results about a new device under test, a data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
Sam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen
Filed: 25 Jun 21
Utility
System and Method for Multi-level Signal Cyclic Loop Image Representations for Measurements and Machine Learning
16 Dec 21
A system includes an input to receive a digital waveform signal, a memory, and one or more processors configured to execute code to cause the one or more processors to: generate a horizontal ramp sweep signal based on the digital waveform signal; receive a selection input to identify a segment of the digital waveform signal; gate the horizontal ramp sweep signal and the digital waveform signal based on the selection input to produce cyclic loop image data for the segment of the digital waveform; store the cyclic loop image data in the memory; and provide the cyclic loop image data as one or more inputs into a machine learning system.
John J. Pickerd, Fabricio Flores
Filed: 11 Jun 21
Utility
Cyclic Loop Image Representation for Waveform Data
16 Dec 21
A test and measurement instrument includes an input to receive a non-return-to-zero (NRZ) waveform signal from a device under test, a ramp generator to use the NRZ waveform signal to generate a ramp sweep signal, a gate to gate the ramp sweep signal and the NRZ waveform signal to produce gated X-axis and Y-axis data, and a display to display the gated X-axis and Y-axis data as a cyclic loop image.
John J. Pickerd
Filed: 11 Jun 21