92 patents
Utility
Test and measurement instrument accessory with reconfigurable processing component
14 Nov 23
A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device.
Charles W. Case, Daniel G. Knierim, Joshua J. O'Brien, Josiah A. Bartlett, Julie A. Campbell
Filed: 19 Jul 21
Utility
System for continuous recording and controllable playback of input signals
14 Nov 23
A test and measurement instrument includes an acquisition memory and a processor structured to store a stream of sampled incoming data samples in the acquisition memory.
Shane L. Arnold
Filed: 7 Dec 20
Utility
Precision, high bandwidth, switching attenuator
7 Nov 23
An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.
Julie A. Campbell, Daniel G. Knierim, Barton T. Hickman
Filed: 8 Apr 22
Utility
Multi-instrument behavior synchronization using jobs and milestones
24 Oct 23
A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.
Timothy E. Sauerwein, Clinton M. Alter, Sean T. Marty, Jenny Yang, Keith D. Rule
Filed: 11 Sep 20
Utility
Abstracting of digital acquisition memory
17 Oct 23
An abstracted digital memory acquisition circuit, including an analog input configured to receive an analog signal, an analog-to-digital converter configured to receive the analog signal and convert the analog signal to a first digital signal, a digital input configured to receive a second digital signal, a controller configured to receive the first digital signal and the second digital signal and output a stream of bits, the stream of bits including the first digital signal and the second digital signal, and a control signal, and an output configured to electrically connect to a digital input of a test and measurement instrument and output the stream of bits and the control signal.
Jonathan D. Clem
Filed: 17 Dec 18
Utility
Real-equivalent-time oscilloscope
17 Oct 23
A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.
Kan Tan
Filed: 22 Feb 21
Utility
Integrated communication link testing
17 Oct 23
A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT.
Pirooz Hojabri, Joshua J. O'Brien, Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan
Filed: 18 May 21
Utility
Test and measurement system for analyzing devices under test
10 Oct 23
A test and measurement system for analyzing a device under test, including a database configured to store test results related to tests performed with one or more prior devices under test, a receiver to receive new test results about a new device under test, a data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
Sam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen
Filed: 25 Jun 21
Utility
Analog signal isolator
26 Sep 23
Disclosed is a signal isolating test instrument, such as an electronics test probe.
Jonathan S. Dandy, Daniel G. Knierim
Filed: 4 May 21
Utility
Explicit solution for DFE optimization with constraints
19 Sep 23
A method of equalizing a communication link includes setting a number of coefficients to a required number, determining a number of pulse responses for a waveform, setting all values in a set of values to zero, repeating, until all values have been assigned, determining a current lowest parameter, using a position of the current lowest parameter as an index, determining a minimum value between a first term multiplied by a main pulse response minus a summation of each parameter multiplied by each value, divided by the current lowest parameter, and a corresponding pulse response, and assigning the minimum value to the value having a position equal to the position of the current lowest parameter, and determining a value of each coefficient in a set of coefficients by multiplying each value with the sign of a corresponding pulse response; defining an equalizer having a number of taps having a value based on the corresponding coefficient; and applying the equalizer to a waveform.
Kan Tan
Filed: 26 May 22
Utility
Multi-segmented Rogowski-coil current sensor
22 Aug 23
A current sensor configured to measure current in a current-carrying conductor.
Josiah A. Bartlett
Filed: 17 Sep 21
Utility
Test and measurement probe having a touchscreen
8 Aug 23
A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250).
Karl A. Rinder, David A. Sailor, Josiah A. Bartlett
Filed: 11 Jun 19
Utility
Indicating a probing target for a fabricated electronic circuit
1 Aug 23
A method for indicating a probing target for a fabricated electronic circuit including: generating an electronic, three-dimensional model based on manufacturing layout information of a fabricated circuit; obtaining, with a vision system, visual environment information for the fabricated circuit; scaling and orienting the three-dimensional model by a scaler and mapper based on the visual environment information; overlaying the three-dimensional model with the visual environment information to produce a correlated image; obtaining an identification of a desired network node of the fabricated circuit; and indicating a probing target, the probing target corresponding to the desired network node of the fabricated circuit.
David Everett Burgess
Filed: 8 Jul 21
Utility
Monitoring waveforms from waveform generator at device under test
4 Jul 23
A test and measurement instrument including a signal generator configured to generate a waveform to be sent over a cable to a device under test (DUT) and a real-time waveform monitor (RTWM) circuit.
Yufang Li, Sicong Zhu, Hua Wei, Fan Huang, Ye Yang
Filed: 1 Oct 18
Utility
Object oriented graphical user interface for a test and measurement instrument
27 Jun 23
A test and measurement instrument including a display and one or more processors configured to display on the display a waveform viewing area with a vertical dimension and an adjustable horizontal dimension, the test and measurement instrument configured to display one or more waveforms in the waveform viewing area, a global settings readout bar located vertically adjacent to the waveform viewing area, the global settings readout bar including a first selectable information badge, wherein when the first selectable information badge is selected, displaying a first menu originating from the first selectable information badge to modify a setting of the test and measurement instrument related to the first selectable information badge.
Gary J. Waldo
Filed: 26 Jul 21
Utility
Test and measurement devices, systems and methods associated with augmented reality
16 May 23
A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store.
Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
Filed: 30 Nov 21
Utility
Discrete offset dithered waveform averaging for high-fidelity digitization of repetitive signals
16 May 23
Methods and devices for digitizing an analog repetitive signal using waveform averaging are described.
Brandon Walter Buckley, Ryan Douglas Muir, Daniel G. Knierim
Filed: 17 Dec 21
Utility
Systems, devices, and methods for measuring direct current/low frequency signal components
25 Apr 23
A test and measurement probe system (100,104), including an input (106) to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit (110), such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output (118) to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument.
Michael J. Mende
Filed: 13 Jul 18
Utility
Noise-compensated jitter measurement instrument and methods
11 Apr 23
A test and measurement device includes an input for receiving a test waveform from a Device Under Test (DUT), where the test waveform has a plurality of input level transitions, a selector structured to respectively and individually extract only those portions of the test waveform that match two or more predefined patterns of input level transitions of the test waveform, a noise compensator structured to individually determine and remove, for each of the extracted portions of the waveform, a component of a jitter measurement caused by random noise of the test and measurement device receiving the test waveform, a summer structured to produce a composite distribution of timing measurements with removed noise components from the extracted portions of the test waveform, and a jitter processor structured to determine a first noise-compensated jitter measurement of the DUT from the composite distribution.
Mark L. Guenther
Filed: 15 Mar 22
Utility
Frequency converter accessory for a test and measurement instrument
4 Apr 23
An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range.
Daniel G. Knierim, Josiah A. Bartlett, Amr Haj-Omar, Donald J. Dalebroux, Barton T. Hickman, Alexander Krauska
Filed: 16 Nov 20