92 patents
Page 2 of 5
Utility
Calibration of magnetic field sensor for current probe
4 Apr 23
A test and measurement instrument for measuring a current in a device under test, comprising an input configured to receive signals from a magnetic field probe; and one or more processors configured to measure, from a signal from the magnetic field probe, a magnetic field generated by a current-carrying conductor of the device under test based on a known current, determine a calibration factor based on the known current and the magnetic field, and generate a calibrated measurement of an unknown current in the current-carrying conductor using a magnetic field generated by the current-carrying conductor based on the unknown current and the calibration factor.
Daniel G. Knierim
Filed: 1 Apr 21
Utility
Low frequency S-parameter measurement
7 Mar 23
A method determines scattering parameters, S-parameters, for a device under test for a first frequency range.
John J. Pickerd, Kan Tan
Filed: 29 May 20
Utility
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14 Feb 23
A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit.
Julie A. Campbell, David Thomas Engquist, Sam J. Strickling
Filed: 12 Nov 20
Utility
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10 Jan 23
Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events.
Patrick A. Smith, Daniel G. Knierim
Filed: 6 Jun 20
Utility
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20 Dec 22
A method of capturing instrument data using a communications device includes sending an actuation signal to a camera to take a photograph of at least one instrument, one of either transmitting or receiving a trigger message between the communications device and the at least one instrument, storing the photograph in a memory on the communications device, determining associated information for the photograph, and transmitting the photograph, associated information and user information to a network.
Frederick B. Kuhlman, III, Shane L. Arnold
Filed: 26 Nov 19
Utility
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6 Dec 22
A method comprising categorizing nodes of a fabricated circuit as being priority nodes and nodes as being inferior nodes; evaluating a first priority node by automatically designating for verification the first priority node, and ascertaining whether a measured signal from the first priority node meets a pass-fail criterion for the first priority node; evaluating, when the measured signal from the first priority node meets the pass-fail criterion, a second priority node by automatically designating for verification the second priority node, and ascertaining whether a measured signal from the second priority node meets a pass-fail criterion for the second priority node; and evaluating, when the measured signal from the first priority node does not meet the pass-fail criterion, a first inferior node, by automatically designating for verification the first inferior node, and ascertaining whether a measured signal from the first inferior node meets a pass-fail criterion for the first inferior node.
David Everett Burgess
Filed: 8 Jul 21
Utility
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27 Sep 22
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT).
Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
Filed: 7 Dec 20
Utility
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20 Sep 22
A test and measurement instrument for analyzing signals using machine learning.
John J. Pickerd
Filed: 11 Sep 20
Utility
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13 Sep 22
A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT.
Sriram Mandyam Krishnakumar, Sunil Mahawar, Mahesha Guttahalli Lakshmipathy, Satish Kumar Makanahalli Ramaiah
Filed: 10 May 20
Utility
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13 Sep 22
Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform.
Sriram Mandyam Krishnakumar, Mahesha Guttahalli Lakshmipathy, Satish Kumar Makanahalli Ramaiah, Vishnu Vardhan Kandan, Rovin Jolly Pulikken
Filed: 10 Jan 20
Utility
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23 Aug 22
A test and measurement instrument for generating an analog waveform, including an interpolator configured to receive a digital signal and output interpolated samples of the digital signal at a sample rate, a filter modulation controller configured to output first filter coefficients at a first time and second filter coefficients at a second time, a convolver configured to generate a convolved signal by convolving the interpolated samples of the digital signal and the first filter coefficients and convolving the interpolated samples of the digital signal and the second filter coefficients; and a digital-to-analog converter configured to convert the convolved signal to an analog signal based on a fixed, constant clock signal.
John J. Pickerd
Filed: 7 Nov 19
Utility
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9 Aug 22
A test and measurement instrument for extracting waveforms from a differential transmission line without disrupting the differential transmission line.
P E Ramesh, Tsuyoshi Miyazaki
Filed: 19 Dec 19
Utility
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12 Jul 22
A method for acquiring a signal from an encapsulated test point on a device under test, includes forming a hole in an encapsulant adjacent to the test point, the hole extending through the encapsulant to the test point, delivering a UV-curable conductive adhesive into the hole such that the delivered adhesive contacts the test point, applying UV light from a UV light source to cure the delivered adhesive, and connecting a conductive element between the cured adhesive and a test and measurement instrument.
Julie A. Campbell, Karl A. Rinder, Regina R. Mrozik
Filed: 4 Oct 20
Utility
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12 Jul 22
A test and measurement device measures an insertion loss of a material under test.
Alexander Krauska
Filed: 3 Jun 20
Utility
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10 May 22
A mechanism is included for jointly determining filter coefficients for Finite Impulse Response (FIR) filters in a Linear, Memory-less Non-linear (LNL), Linear compensator.
Karen Hovakimyan, Pirooz Hojabri, Tigran Hovakimyan, Norayr Yengibaryan
Filed: 9 Apr 18
Utility
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3 May 22
A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode.
Noah Brummer
Filed: 21 Apr 20
Utility
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15 Mar 22
A test and measurement instrument, including at least one port configured to receive a signal from a device under test (DUT), the signal including a current signal acquired across a magnetic core of the DUT and a voltage signal acquired across the magnetic core of the DUT, and one or more processors.
U N Vasudev, Suman Babu Alaparthi, Niranjan R Hegde, Krishna N H Sri
Filed: 10 Oct 19
Utility
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15 Feb 22
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT).
Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
Filed: 5 Jul 18
Utility
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1 Feb 22
A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display.
Keith D. Rule, Sean T. Marty
Filed: 6 Jan 20
Utility
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1 Feb 22
A test and measurement device having a signal source, including an impairment generator configured to output an impairment and a waveform synthesizer.
Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan, Hungming Chang
Filed: 12 Aug 19