92 patents
Page 4 of 5
Utility
Modular power supply monitoring by accessory interface of a test and measurement instrument
23 Mar 21
A modular power supply including a voltage regulator configured to output a voltage, a first output configured to connect to a device under test and output the voltage from the regulator, a microcontroller connected to the voltage regulator, and an interface configured to connect to a test and measurement instrument.
Haiping Lv, Hai Wen Yu
Filed: 20 Apr 18
Utility
Passive variable continuous time linear equalizer with attenuation and frequency control
26 Jan 21
A continuously or step variable passive noise filter for removing noise from a signal received from a DUT added by a test and measurement instrument channel.
John J. Pickerd, Kan Tan, Pirooz Hojabri
Filed: 29 Aug 18
Utility
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19 Jan 21
A test and measurement system including a plurality of channels and one or more processors.
John J. Pickerd, Pirooz Hojabri, Kan Tan
Filed: 20 Apr 18
Utility
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19 Jan 21
A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors.
U N Vasudev, Gajendra Kumar Patro, Krishna N H Sri
Filed: 15 Oct 18
Utility
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12 Jan 21
A test and measurement instrument having a signal generator circuit and a waveform monitor circuit for monitoring a waveform received at a device under test (DUT).
Jianjie Huang, Sicong Zhu, Hu Tang, Yufang Li, Jin Qian
Filed: 20 Jul 17
Utility
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7 Dec 20
A method for electrically connecting a test and measurement instrument to a via of a printed circuit board, PCB, the method comprising: dispensing a UV-curable conductive adhesive into a back-drilled hole formed in the PCB, the back-drilled hole extending to the via, such that the dispensed adhesive contacts the via; curing the dispensed adhesive by applying a UV light source to the dispensed adhesive; and connecting a test and measurement instrument to the cured adhesive using a conductive member.
Julie A. Campbell, Karl A. Rinder, Daniel G. Knierim
Filed: 26 Feb 19
Utility
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7 Dec 20
An apparatus configured to acquire S-parameters of a communications channel includes a physical interface configured to transmit and receive signals through a communications channel under test, a processor, configured to execute instructions that, when executed cause the processor to: send a first data pattern from the transmitter through the communications channel at a first data rate; acquire a first waveform corresponding to the first data pattern and determine a first pulse response; calculate a first transfer function from the first pulse response; send a second data pattern from the transmitter through the communications channel at a second data rate; acquire a second waveform corresponding to the second data pattern and determine a second pulse response; calculate a second transfer function from the second pulse response; and combine the first and second transfer functions to determine an S-parameter of the communications channel.
Kan Tan
Filed: 28 Jan 20
Utility
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23 Nov 20
An apparatus for coupling a test and measurement instrument to a device under test comprises a clip structured to be attached between two conductive portions of the device under test, and an insert structured to be removably installed in the clip.
Julie A. Campbell
Filed: 24 Mar 19
Utility
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24 Aug 20
Disclosed is a differential test probe tip.
Michael J. Mende, David T. Engquist, Richard A. Booman
Filed: 24 Aug 17
Utility
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10 Aug 20
A method of conductively bonding a test probe tip having an electrically conductive element to a device under test (DUT) having an electrical connection point, the method comprising: positioning the electrically conductive element of the test probe tip proximate to the electrical connection point of the DUT; dispensing a UV-cure conductive adhesive between the electrically conductive element and the electrical connection point of the DUT, the dispensed UV-cure conductive adhesive continuously covering at least a portion of the electrically conductive element and at least a portion of the electrical connection point of the DUT; and bonding the dispensed UV-cure conductive adhesive to the electrically conductive element and the electrical connection point of the DUT by applying UV-light from a UV-light source to the dispensed UV-cure conductive adhesive.
Julie A. Campbell, Regina R. Mrozik
Filed: 10 May 18
Utility
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3 Aug 20
A time-interleaved digital-to-analog converter system, comprising a digital pre-distorter configured to receive an input digital signal and an error signal and output a distorted digital signal based on the input digital signal and the error signal; a time-interleaved digital-to-analog converter having a first sample rate, the time-interleaved digital-to-analog converter configured to convert the distorted digital signal to an analog signal; and a calibration system.
Karen Hovakimyan, Gregory A. Martin, Daniel G. Knierim
Filed: 29 Jul 19
Utility
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27 Jul 20
A multilayer circuit board having a central conductor and core layers between a first set of alternating layers and a second set of alternating layers.
George S. Curtis
Filed: 26 Dec 18
Utility
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20 Jul 20
An electronic switch includes a substrate and a rotator assembly.
James D. Pileggi, Daniel G. Knierim
Filed: 22 Jul 18
Utility
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15 Jun 20
The disclosure includes an electro-optical sensor.
Michael J. Mende, Richard A. Booman
Filed: 8 Apr 18
Utility
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8 Jun 20
Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events.
Patrick A. Smith, Daniel G. Knierim
Filed: 12 Jan 16
Utility
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1 Jun 20
A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.
David A. Holaday, Joshua J. O'Brien
Filed: 12 Apr 18
Utility
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25 May 20
A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode.
Noah Brummer
Filed: 28 Dec 16
Utility
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18 May 20
A test and measurement instrument, such as an oscilloscope, including one or more ports to receive one or more signals from a device under test, a trigger enable logic circuit configured to output a trigger enabled signal when a trigger enable event occurs within the one or more signals, the trigger enable event being a real-time event of the one or more signals, one or more trigger logic circuits configured to generate a plurality of trigger signals when the trigger enable signal is received, each trigger signal being generated when a trigger event occurs within one of the one or more signals, and an acquisition circuit configured to acquire and store data in a memory in response to each of the trigger signals.
David L. Kelly, Jed H. Andrews, Patrick A. Smith, Michael A. Martin
Filed: 26 Oct 17
Utility
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20 Apr 20
Disclosed herein are systems and methods for converting physical input signals into bitstreams using syntax trees regardless of the physical input signal's protocol.
Mark Anderson Smith, Michael Scott Silliman, Andrew Loofburrow, Eric T. Anderson
Filed: 8 Apr 18
Utility
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9 Mar 20
Disclosed is a test and measurement probe.
Michael J. Mende, Richard A. Booman, Wayne M. Wilburn
Filed: 28 Sep 17