7578 patents
Page 55 of 379
Utility
Electroplating systems and methods with increased metal ion concentrations
27 Jun 23
Electroplating methods and systems are described that include adding a metal-ion-containing starting solution to a catholyte to increase a metal ion concentration in the catholyte to a first metal ion concentration.
Kwan Wook Roh, Charles Sharbono, Kyle M. Hanson
Filed: 28 Jan 22
Utility
Local shape deviation in a semiconductor specimen
27 Jun 23
There is provided a system and method of a method of detecting a local shape deviation of a structural element in a semiconductor specimen, comprising: obtaining an image comprising an image representation of the structural element; extracting, from the image, an actual contour of the image representation; estimating a reference contour of the image representation indicative of a standard shape of the structural element, wherein the reference contour is estimated based on a Fourier descriptor representative of the reference contour, the Fourier descriptor being estimated using an optimization method based on a loss function specifically selected to be insensitive to local shape deviation of the actual contour; and performing one or more measurements representative of one or more differences between the actual contour and the reference contour, the measurements indicative of whether a local shape deviation is present in the structural element.
Roman Kris, Ilan Ben-Harush, Rafael Bistritzer, Vadim Vereschagin, Elad Sommer, Grigory Klebanov, Arundeepth Thamarassery, Jannelle Anna Geva, Gal Daniel Gutterman, Einat Frishman, Sahar Levin
Filed: 2 Sep 21
Utility
3ttjndoydkfwhspy1pr2d855usqdj6bb9z7ia
27 Jun 23
There is provided a system and method of automatic optimization of an examination recipe.
Amir Bar
Filed: 17 Mar 22
Utility
m1k4 790yxq80oalaml7s679255v31el50zpx0m6lphgubno1
27 Jun 23
A method and a system for preparing a substrate with three dimensional features for immersion based inspection.
Tai Kuzniz
Filed: 14 Feb 22
Utility
xsy24if8n74lxxwu0mgb0w86o
27 Jun 23
According to an embodiment, a method for automated critical dimension measurement on a substrate for display manufacturing is provided.
Bernhard G. Mueller, Robert Trauner, Bernhard Schüler, Peter C. Staffansson, Kulpreet Singh Virdi, Volker Daiker
Filed: 22 Feb 18
Utility
1ant185xhxyys3117z9dyc02u6akt2e0c51ovknduxu1xa
27 Jun 23
Disclosed is a computerized method for detecting defects on a sample.
Guy Shwartz, Ido Almog
Filed: 27 Jan 21
Utility
5nefpjhr3ztg3fn2rydgactmo0ue6hhyt8oqam y1
27 Jun 23
Certain aspects of the present disclosure provide techniques for automatically detecting and classifying tumor regions in a tissue slide.
Parijat Prakash Prabhudesai, Ganesh Kumar Mohanur Raghunathan, Sumit Kumar Jha, Aditya Sista, Narasimha Murthy Chandan
Filed: 21 Apr 21
Utility
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27 Jun 23
A method for determining whether to modify a manufacturing process recipe is provided.
Upendra V. Ummethala, Blake Erickson, Prashanth Kumar, Michael Kutney, Steven Trey Tindel, Zhaozhao Zhu
Filed: 19 Jul 21
Utility
0rn9483lyguk6vluewt7yirlhk
27 Jun 23
A method and apparatus for loading substrates in an inspection station is disclosed herein.
Asaf Schlezinger, Markus J. Stopper
Filed: 10 Dec 20
Utility
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27 Jun 23
ABSTRACT OF THE DISCLOSURE The present disclosure generally relates to battery anode structures with dielectric coating and methods of forming the same.
Subramanya P. Herle
Filed: 26 Sep 19
Utility
v1pwtj7mhvxtkvbqgrcwxz
27 Jun 23
Embodiments described herein relate to sub-pixel circuits and methods of forming sub-pixel circuits that may be utilized in a display such as an organic light-emitting diode (OLED) display.
Ji Young Choung, Dieter Haas, Yu-hsin Lin, Jungmin Lee, Seong Ho Yoo, Si Kyoung Kim
Filed: 26 Oct 22
Utility
1ndseczv2q9wrgzm88gn0v2sk72cib0r6cd544ilw8w6lrho8s1dr6snlr
27 Jun 23
Embodiments described herein relate to sub-pixel circuits and methods of forming sub-pixel circuits that may be utilized in a display such as an organic light-emitting diode (OLED) display.
Ji-young Choung, Dieter Haas, Yu Hsin Lin, Jungmin Lee, Seong Ho Yoo, Si Kyoung Kim
Filed: 26 Oct 22
Utility
v147xmoumc4bvmbe0xsphzptxetfd59jufp9wp5uau5
30 May 23
A substrate carrier configured to be attached to a polishing system for polishing a substrate is described herein.
Steven M. Zuniga, Andrew Nagengast
Filed: 18 Feb 21
Utility
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30 May 23
A chemical mechanical polishing system includes a platen to support a polishing pad, a carrier head to hold a substrate and bring a lower surface of the substrate into contact with the polishing pad, and an in-situ friction monitoring system including a friction sensor.
Nicholas Wiswell, Chih Chung Chou, Dominic J. Benvegnu
Filed: 25 Jul 19
Utility
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30 May 23
Described herein is a protective coating composition that provides erosion and corrosion resistance to a coated article (such as a chamber component) upon the article's exposure to harsh chemical environment (such as hydrogen based and/or halogen based environment) and/or upon the article's exposure to high energy plasma.
Vahid Firouzdor, Christopher Laurent Beaudry, Hyun-Ho Doh, Joseph Frederick Behnke, Joseph Frederick Sommers
Filed: 10 Apr 20
Utility
gaw60xecxq0detxxys0l8qcznarljiy8nxn7jd1543tabywunfqub93md3ya
30 May 23
Methods and apparatus for passivating a target are provided herein.
Chao Du, Xing Chen, Keith A. Miller, Jothilingam Ramalingam, Jianxin Lei
Filed: 13 Jun 22
Utility
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30 May 23
Embodiments described herein relate to a gas line cleaning system and a method of cleaning gas lines.
Gang Peng, Halbert Chong, Marcus Pereira, David W. Groechel
Filed: 15 May 19
Utility
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30 May 23
Apparatuses and methods for measuring substrate temperature are provided.
Joseph M. Ranish
Filed: 29 Oct 21
Utility
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30 May 23
An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.
Avishek Ghosh, Byung-Sung Kwak, Todd Egan, Robert Jan Visser, Gangadhar Banappanavar, Dinesh Kabra
Filed: 1 Mar 21
Utility
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30 May 23
A computer-based method for three-dimensional surface metrology of samples based on scanning electron microscopy and atomic force microscopy.
Ido Almog, Ron Bar-Or, Lior Yaron
Filed: 18 Mar 22