1577 patents
Page 40 of 79
Utility
Semiconductor device and method for image processing and image compression using the semiconductor device
13 Apr 21
The present invention provides a semiconductor device enabling efficient compression without increasing the circuit size and a processing method using the semiconductor device.
Ryoji Hashimoto, Keisuke Matsumoto, Nhat Van Huynh
Filed: 10 May 19
Utility
Semiconductor device
13 Apr 21
A semiconductor device includes first and second voltage control lines for a first memory block and third and fourth voltage control lines for a second memory block, for driving gate lines for memory transistors; a first decoder driving the first and third voltage control lines; a second decoder driving the second and fourth voltage control lines; and a control circuit controlling a voltage for the first and second decoders.
Yoji Kashihara
Filed: 17 Jan 19
Utility
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13 Apr 21
method of manufacturing a semiconductor device capable of manufacturing a miniaturized semiconductor device is provided.
Masaaki Kanazawa
Filed: 9 May 19
Utility
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13 Apr 21
This invention is to improve a performance of a semiconductor device.
Yoshiyuki Kawashima, Takashi Hashimoto
Filed: 17 Oct 19
Utility
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13 Apr 21
In the semiconductor device, a first defect formation preventing film is formed on the first wiring side, and a second defect formation preventing film is formed on the second wiring side. when a ratio of an infrared absorption intensity corresponding to a bond between silicon and hydrogen to an infrared absorption intensity corresponding to a bond between silicon and oxygen is defined as an abundance ratio, the abundance ratio in the first defect formation preventing film is smaller than the abundance ratio in the second interlayer insulating film.
Naohito Suzumura, Kazuyuki Omori
Filed: 24 Jul 19
Utility
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13 Apr 21
A hybrid-bonding-type solid-state imaging device is provided that prevents moisture from entering through the bonded interface and other areas.
Hidenori Sato, Koji Iizuka, Takeshi Kamino
Filed: 19 Feb 19
Utility
rh3lxkssw7ry3jgh78zga4zqrry32jt26wrfdt7zn1
8 Apr 21
A semiconductor device has an impurity region covering a bottom of a gate trench and a column region.
Machiko SATO, Akihiro SHIMOMURA
Filed: 24 Aug 20
Utility
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8 Apr 21
To provide a correction method of resolver correction device and resolver correction device that can reduce rotation angle (the rotation speed) detection error caused by resolver.
Yoshifumi IKENAGA, Yuji SHIMIZU, Akane ABE
Filed: 11 Sep 20
Utility
ecoy2cxo7uq7l96enquxdmpr59ihbuctyx1jt41xbmlrfc8fgfdp9
6 Apr 21
A switch group selectively outputs a signal input from IC terminals and a reference voltage.
Asaki Mizuta
Filed: 15 Mar 19
Utility
i6976h933i1o0vx4olzweq0e2q7mmnomjjc3v35mrz4qi5
6 Apr 21
In order to correct the rotation angle value without an increase in the circuit size, a rotation period measurement unit measures a rotation period of a rotary shaft in which a rotation angle is detected by using a resolver that outputs a signal corresponding to the rotation angle of the rotary shaft.
Yoshitaka Shibuya, Hayato Kimura
Filed: 29 Aug 18
Utility
acbg78y500jwwl6ky66x4qz0otenka3xim0saj2kal68jy0bfap02tpj71u
6 Apr 21
Debugging a program in an apparatus using a lockstep method are more efficiently performed and a semiconductor apparatus includes a first processor core, a second processor core, a first debug circuit, a second debug circuit, and an error control circuit capable of outputting an error signal for stopping execution of a program by the first processor core and the second processor core.
Yuta Arai, Kyoko Hasegawa, Hiroyuki Sasaki
Filed: 8 May 19
Utility
ebrobz3h4ua818q6jihfu9a14px7xmkz5q4kwse3h98dba
6 Apr 21
A semiconductor device capable of improving operating margins is provided.
Makoto Yabuuchi, Shinji Tanaka
Filed: 30 Oct 19
Utility
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30 Mar 21
A semiconductor device capable of detecting whether test operation is normal is provided.
Yoshisato Yokoyama, Shinji Tanaka
Filed: 14 Aug 19
Utility
yx56hubg19m6nx7wdn4kc72qxy58326rucdr1r5ftko8jnvrwy
25 Mar 21
A semiconductor device includes first and second CPUs, first and second SPUs for controlling a snoop operation, a controller supporting ASIL D of a functional safety standard and a memory.
Yuki HAYAKAWA, Toshiyuki KAYA, Shinichi SHIBAHARA
Filed: 4 Dec 20
Utility
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25 Mar 21
To provide a semiconductor device having improved reliability.
Tetsuya YOSHIDA
Filed: 3 Dec 20
Utility
jmjem181e2v113u7fpw3g9znuswcfkgx1td623o790gk2yk
23 Mar 21
A semiconductor device manufacturing technique which allows reduction of semiconductor chip size.
Akihiko Yoshioka, Shinya Suzuki
Filed: 7 Apr 20
Utility
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23 Mar 21
A polycrystalline silicon resistor is large in coefficient of fluctuation in resistance between before and after the completion of a package molding process.
Chiemi Hashimoto, Kosuke Yayama, Katsumi Tsuneno, Tomokazu Matsuzaki
Filed: 8 Jun 18
Utility
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18 Mar 21
A semiconductor device according to an embodiment includes a holding circuit including a buffer configured to obtain a heat stress information having a temperature dependency every predetermined period and a stress counter configured to accumulate the heat stress information and hold the accumulated value as a cumulative stress count value, a control circuit including an operation determination threshold value, and a wireless communication circuit.
Kan TAKEUCHI, Yoshio TAKAZAWA, Fumio TSUCHIYA, Daisuke OSHIDA, Naoya OTA, Masaki SHIMADA, Shinya KONISHI
Filed: 2 Sep 20
Utility
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18 Mar 21
A semiconductor device includes an output transistor that supplies a power to a load, a sense transistor that detects a load current of the output transistor, first and second transistors connected in parallel to an output of the sense transistor, an amplifier which has an inverting input coupled to an output of the output transistor, a non-inverting input coupled to the output of the sense transistor, and an output coupled to each gate of the first and second transistors, a first voltage converter coupled to an output of the first transistor, and a comparator that compares an output voltage of the first voltage converter with a predetermined voltage.
Naohiro YOSHIMURA, Makoto TANAKA
Filed: 30 Jul 20
Utility
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16 Mar 21
An impedance measuring semiconductor circuit that measures impedance of a specimen.
Kunihiko Watanabe, Gaku Masumoto, Kazuo Okado
Filed: 12 Sep 18