1577 patents
Page 3 of 79
Utility
Semiconductor Device
30 Nov 23
A semiconductor device includes a phase interpolation circuit including an N-bit current digital-analog conversion circuit, a switch circuit, a capacitive element, an inverter, and a control logic circuit.
Yusuke IMANAKA, Atsushi MOTOZAWA
Filed: 26 Apr 23
Utility
Angle Error Correction Device
30 Nov 23
An angle error correction device includes an actual rotation angle measurement circuit that converts a rotation angle information of a rotation angle detection target to an angle counter value for each predetermined angle; an actual speed calculator that calculates an actual rotation speed for each predetermined angle from the angle counter value; a curve interpolation circuit that generates a curve interpolation equation from the angle counter value; an ideal speed estimator that calculates an estimated ideal rotation speed for each predetermined angle using the curve interpolation equation; an angle error detector that calculates an angle error for each predetermined angle by integrating an angle ripple ratio determined by the actual rotation speed and the estimated ideal rotation speed; an angle error table in which the angle error calculated by the angle error detector is stored; and a correction circuit that corrects the rotation angle information using the angle error table.
Masashi TSUBOTA
Filed: 31 May 22
Utility
Semiconductor Device and Scan Testing Method
30 Nov 23
Yucong ZHANG
Filed: 31 May 22
Utility
Semiconductor Device and Method of Manufacturing the Same
30 Nov 23
A semiconductor device includes a lead, a semiconductor substrate, a back-surface electrode provided between the semiconductor substrate and the lead, and a solder layer configured to connect the back-surface electrode and the lead.
Kodai OZAWA, Sho NAKANISHI
Filed: 22 Mar 23
Utility
Method of Manufacturing Semiconductor Device
30 Nov 23
A method of manufacturing a semiconductor device includes: forming a silicon oxide film covering each of a first main surface and a second main surface of a semiconductor substrate; forming a redistribution wiring on the first main surface side of the semiconductor substrate; and grinding the second main surface of the semiconductor substrate.
Futoshi KOMATSU, Tomoo NAKAYAMA, Katsuhiro UCHIMURA, Hiroshi INAGAWA
Filed: 16 Mar 23
Utility
Semiconductor Device and Method of Manufacturing the Same
30 Nov 23
In a semiconductor substrate, an n-type source region, an n-type drain region, a first p-type semiconductor region, and a second p-type semiconductor region surrounding the n-type source region and the first p-type semiconductor region are formed.
Yotaro GOTO
Filed: 28 Mar 23
Utility
Semiconductor Device
30 Nov 23
A technique for enhancing reliability is provided.
Takayuki OOTANI
Filed: 20 Apr 23
Utility
Semiconductor device and method of manufacturing the same
28 Nov 23
An IGBT capable of handling high-speed switching while reducing a leakage current of a semiconductor device including the IGBT is provided.
Tomohiro Imai, Yoshito Nakazawa, Katsumi Eikyu
Filed: 18 Aug 21
Utility
Semiconductor device and method of manufacturing the same
28 Nov 23
The source region, drain region, buried insulating film, gate insulating film, and gate electrode of the semiconductor device are formed in a main surface of a semiconductor substrate.
Makoto Koshimizu, Yasutaka Nakashiba
Filed: 20 Jul 21
Utility
Semiconductor device and error detection methods
28 Nov 23
A semiconductor device includes a syndrome generation circuit configured to generate a syndrome code based on data and an error correction code corresponding to the data, an error determination circuit configured to detect a 1-bit error in the data based on the syndrome code, and multi-bit error detection circuit configured to determine whether the data detected to have 1-bit error includes a multi-bit error by using an error address of the data detected to have 1-bit error and an error syndrome code of the data detected to have 1-bit error.
Takashi Ishibashi, Hiroyuki Hashimoto
Filed: 6 May 22
Utility
Semiconductor Device and Control Method for the Same
23 Nov 23
A semiconductor device includes a plurality of processors capable of executing a plurality of virtual machines and a cache memory.
Masahiro HASEGAWA
Filed: 19 May 22
Utility
Debug Apparatus and Recording Medium
23 Nov 23
A debug apparatus for performing allocation of target programs in which temperature is uniformized is provided.
Tomoyoshi UJII, Yuki MORI, Kazunori OCHIAI
Filed: 19 May 22
Utility
Semiconductor Device
23 Nov 23
A semiconductor device capable of reducing power consumption is provided.
Kazuaki TERASHIMA, Atsushi NAKAMURA, Yonghua WANG
Filed: 20 Mar 23
Utility
Method of Manufacturing Semiconductor Device
23 Nov 23
To manufacture a semiconductor device, a first heat treatment for curing a first adhesive material of a conductive paste type is performed, after a semiconductor chip is mounted on a die pad of a lead frame via the first adhesive material.
Kosuke KITAICHI, Masatoshi SUGIURA, Hideaki TAMIMOTO, Takehiko MAEDA, Keita TAKADA, Yoshitaka KYOUGOKU
Filed: 28 Feb 23
Utility
Semiconductor Device and Method of Manufacturing the Same
23 Nov 23
A semiconductor device includes a first electrode and a second electrode configuring a MIM capacitor.
Takeshi NAKURA
Filed: 22 Mar 23
Utility
Manufacturing Method of Semiconductor Device
23 Nov 23
Increasing in a contact-resistance between a trench gate lead-out electrode and a gate lead-out contact member is suppressed.
Kouichi KONISHI
Filed: 2 Mar 23
Utility
Semiconductor Device and Semiconductor System
23 Nov 23
A semiconductor device includes a receiving terminal for receiving a signal transmitted through a signal transmission line, a reference plane voltage terminal connected to a refence plane as a refence for the signal on the signal transmission line and a voltage generating circuit configured to generate a refence plane voltage to be supplied to the reference plane voltage terminal based on the signal received by the receiving terminal.
Yusuke AIHARA, Kuniyasu TAJIMA, Naoyuki HAMANISHI, Tadashi KAMEYAMA
Filed: 19 May 22
Utility
Semiconductor device
21 Nov 23
A semiconductor device includes a main circuit and a peripheral circuit inputting/outputting a signal from/to the main circuit, the main circuit including: a memory cell array; a sense amplifier; a first output holding circuit holding the read data output from the sense amplifier; a second output holding circuit receiving the read data as its input output from the first output holding circuit; and a delay circuit outputting a delay signal for activating the second output holding circuit to be later than the first output holding circuit.
Yohei Sawada
Filed: 5 Nov 21
Utility
Manafacturing method for power MOSFET semiconductor device with improved breakdown voltage
21 Nov 23
A semiconductor device has an impurity region covering a bottom of a gate trench and a column region.
Machiko Sato, Akihiro Shimomura
Filed: 1 Sep 22
Utility
Semiconductor device
21 Nov 23
A semiconductor device includes a first transistor that flows a load current to an external load; a current generation circuit that outputs a current corresponding to a power consumption generated in an overheat detection target when the load current flows the overheat detection target; a resistor-capacitor-network comprising a resistor and a capacitor corresponding to a thermal resistance and a thermal capacitance of the overheat detection target, and having one end coupled to the current generation circuit; an overheat detection circuit coupled to a connection point of the current generation circuit and the resistor-capacitor-network; and a voltage source that sets a voltage of the connection point of the current generation circuit and the resistor-capacitor-network to a predetermined voltage.
Hiroki Nagatomi, Makoto Tanaka
Filed: 30 Mar 22